# US 2010/0167407 A1 · Nickel Crucible for Melting Analytical Sample, Method of Preparing Analytical Sample and Method of Analysis

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- Number: US 2010/0167407 A1
- Document ID: US20100167407A1
- Status: Published application
- Kind: A1
- Application number: 12/278,889
- Filed: 2007-02-15
- Published: 2010-07-01
- Earliest claimed: 2006-02-22
- Assignees: Nippon Mining & Metals Co., Ltd.
- Inventors: Masahiro Sakaguchi; Mitsuru Yamaguchi; Tomio Takahashi; Kouichi Takemoto
- Web page: https://patentgrep.com/patent/US20100167407A1

## CPC

- G01N 1/44: Sample treatment involving radiation, e.g. heat
- B01L 3/04: Crucibles
- B01L 2300/12: Specific details about materials
- Y10T 436/25875: Gaseous sample or with change of physical state
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- B01L: CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- Y10T: TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION

## Abstract

A nickel crucible used for melting an analytical sample in the pretreatment of the analytical sample, characterized in that the purity of the nickel crucible is 99.9999 wt % or higher. Also provided is a method of analysis, comprising melting a sample by the use of the nickel crucible for melting having a purity of 99.9999 wt % or higher, and analyzing the melt to thereby obtain an analytical result in which the respective lower limits of determination of Mn, Al, Si, Mg, Pb, Fe, Co, Ti, Cu, Cr, Zr, Mo, and W are Mn: 5 wtppm, Al: 10 wtppm, Si: 10 wtppm, Mg: 5 wtppm, Pb: 5 wtppm, Fe: 5 wtppm, Co: 5 wtppm, Ti: 20 wtppm, Cu: 20 wtppm, Cr: 10 wtppm, Zr: 5 wtppm, Mo: 2 wtppm, and W:10 wtppm. In light of the recent analytical technology demanded of fast and accurate measurement of high purity materials, high purity analysis is attained through inhibition of mixing of impurities from the crucible.

## Claims

### Claim 1

A nickel crucible used for melting an analytical sample in the pretreatment of the analytical sample, wherein the purity of the nickel crucible is 99.9999 wt % or higher.

### Claim 2 (depends on 1)

The nickel crucible used for melting according to claim 1 which uses a basic flux comprising one or more types of alkali chemicals selected from Na2CO3, K2CO3, H3BO3, NaOH, KOH, Na2B2O7, Li2B2O7 and the like, or a basic flux added with one or more types of oxidizing agents selected from Na2O, Na2O2, K2O, K2O2, KNO3, KClO3 and the like, or one or more types of acid flux selected from Na2S2O7, K2S2O7, NaHSO4 and the like to melt the analytical sample.

### Claim 3

A method of preparing an analytical sample using a high purity nickel crucible, including a step of preliminarily melting a sample in a nickel crucible having a purity of 99.9999 wt % or higher to obtain the analytical sample.

### Claim 4 (depends on 3)

The method of preparing an analytical sample according to claim 3, further including a step of measuring and placing a sample in the crucible, and melting the sample using a basic flux comprising one or more types of alkali chemicals selected from Na2CO3, K2CO3, H3BO3, NaOH, KOH, Na2B2O7, Li2B2O7 and the like, or a basic flux added with one or more types of oxidizing agents selected from Na2O, Na2O2, K2O, K2O2, KNO3, KClO3 and the like, or one or more types of acid flux selected from Na2S2O7, K2S2O7, NaHSO4 and the like to obtain the analytical sample.

### Claim 5

A method of analysis comprising melting a sample by the use of the nickel crucible for melting having a purity of 99.9999 wt % or higher, and analyzing the melt to thereby obtain an analytical result in which the respective lower limits of determination of Mn, Al, Si, Mg, Pb, Fe, Co, Ti, Cu, Cr, Zr, Mo, and W are Mn: 5 wtppm, Al: 10 wtppm, Si: 10 wtppm, Mg: 5 wtppm, Pb: 5 wtppm, Fe: 5 wtppm, Co: 5 wtppm, Ti: 20 wtppm, Cu: 20 wtppm, Cr: 10 wtppm, Zr: 5 wtppm, Mo: 2 wtppm, and W: 10 wtppm.