# US 2010/0165541 A1 · Dielectric ceramics, and laminated ceramic capacitor > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2010/0165541 A1 - Document ID: US20100165541A1 - Status: Published application - Kind: A1 - Application number: 12/723,942 - Filed: 2010-03-15 - Published: 2010-07-01 - Earliest claimed: 2007-09-19 - Assignees: Murata Manufacturing Co., Ltd. - Inventors: Takehisa Sasabayashi; Tomoyuki Nakamura; Masayuki Ishihara; Takayuki Yao - Web page: https://patentgrep.com/patent/US20100165541A1 ## CPC - H01G 4/1227: {based on alkaline earth titanates} - C04B 35/4682: {based on BaTiO3 perovskite phase} - C04B 35/49: containing also titanium oxides or titanates - C04B 35/6262: {of calcined, sintered clinker or ceramics} - C04B 35/62665: {Flame, plasma or melting treatment} - C04B 35/62685: {characterised by the order of addition of constituents or additives} - H01B 3/12: ceramics - H01G 4/30: Stacked capacitors (H01G4/33 takes precedence) - C04B 2235/3201: Alkali metal oxides or oxide-forming salts thereof - C04B 2235/3203: Lithium oxide or oxide-forming salts thereof - C04B 2235/3206: Magnesium oxides or oxide-forming salts thereof - C04B 2235/3208: Calcium oxide or oxide-forming salts thereof, e.g. lime - C04B 2235/3213: Strontium oxides or oxide-forming salts thereof - C04B 2235/3217: Aluminum oxide or oxide forming salts thereof, e.g. bauxite, alpha-alumina - C04B 2235/3224: Rare earth oxide or oxide forming salts thereof, e.g. scandium oxide - C04B 2235/3225: Yttrium oxide or oxide-forming salts thereof - C04B 2235/3227: Lanthanum oxide or oxide-forming salts thereof - C04B 2235/3229: Cerium oxides or oxide-forming salts thereof - C04B 2235/3239: Vanadium oxides, vanadates or oxide forming salts thereof, e.g. magnesium vanadate - C04B 2235/3241: Chromium oxides, chromates, or oxide-forming salts thereof - C04B 2235/3244: Zirconium oxides, zirconates, hafnium oxides, hafnates, or oxide-forming salts thereof - C04B 2235/3256: Molybdenum oxides, molybdates or oxide forming salts thereof, e.g. cadmium molybdate - C04B 2235/3258: Tungsten oxides, tungstates, or oxide-forming salts thereof - C04B 2235/3262: Manganese oxides, manganates, rhenium oxides or oxide-forming salts thereof, e.g. MnO - C04B 2235/3272: Iron oxides or oxide forming salts thereof, e.g. hematite, magnetite - C04B 2235/3275: Cobalt oxides, cobaltates or cobaltites or oxide forming salts thereof, e.g. bismuth cobaltate, zinc cobaltite - C04B 2235/3279: Nickel oxides, nickalates, or oxide-forming salts thereof - C04B 2235/3281: Copper oxides, cuprates or oxide-forming salts thereof, e.g. CuO or Cu2O - C04B 2235/3284: Zinc oxides, zincates, cadmium oxides, cadmiates, mercury oxides, mercurates or oxide forming salts thereof - C04B 2235/3289: Noble metal oxides - C04B 2235/3291: Silver oxides - C04B 2235/3409: Boron oxide, borates, boric acids, or oxide forming salts thereof, e.g. borax - C04B 2235/3418: Silicon oxide, silicic acids or oxide forming salts thereof, e.g. silica sol, fused silica, silica fume, cristobalite, quartz or flint - C04B 2235/656: characterised by specific heating conditions during heat treatment - C04B 2235/6582: Hydrogen containing atmosphere - C04B 2235/6584: at an oxygen percentage below that of air - C04B 2235/6588: Water vapor containing atmospheres - C04B 2235/79: Non-stoichiometric products, e.g. perovskites (ABO3) with an A/B-ratio other than 1 - H01G: CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE (selection of specified materials as dielectric H01B3/00; capacitors having potential barriers H10D1/62, H10K10/10) - C04B: LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE {(roofing granules E04D7/005)}; CERAMICS (devitrified glass-ceramics C03C10/00); REFRACTORIES; TREATMENT OF NATURAL STONE - H01B: CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES (selection for magnetic properties H01F1/00; waveguides H01P {; printed circuits H05K}) ## Abstract A dielectric ceramic contains a BaTiO3-based compound as a main ingredient, and can be represented by the general formula: 100AmBO3+aNiO+bROn+cMOv+dMgO+eXOw where R represents a rare earth element such as Dy, M represents a metal element such as Mn, and X represents a sintering aid component containing Si. Ni is uniformly solid-solved in crystal grains, and the solid-solution region of the rare earth element in the crystal grains is an average 10% or less in terms of a cross section ratio. 0.96≦m≦1.030, 0.05≦a≦3, 0.1≦b≦1.5, 0.1≦c≦1.0, 0.1≦d≦1.5, and 0.05≦e≦3.5 are satisfied. A laminated ceramic capacitor has dielectric layers formed of the dielectric ceramic. As a result, a dielectric ceramic, and a laminated ceramic capacitor having excellent AC voltage characteristics, capable of keeping desired dielectric characteristics and excellent temperature characteristics, and having excellent withstand voltage and capable of ensuring reliability can be realized. ## Claims ### Claim 1 A dielectric ceramic comprising a perovskite compound represented by the general formula ABO3 in which A is Ba or Ba in combination with at least one of Ca and Sr, and B is Ti or Ti in combination with at least one of Zr and Hf as a main ingredient, a rare earth element R which is at least one member selected from the group consisting of La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y, and Ni, and having crystal grains and crystal grain boundaries, wherein said Ni is uniformly or substantially uniformly solid-solved in the crystal grains, and an average solid-solution region of said rare earth element R in a cross section of said crystal grains is 10% or less. ### Claim 2 (depends on 1) The dielectric ceramic according to claim 1, wherein said composition is represented by a general formula: 100AmBO3+aNiO+bROn+cMOv+dMgO+eXOw wherein M is at least one metal element selected from the group consisting of Mn, Fe, Cu, Co, V, W, Cr, Mo and Al, and X is a sintering aid component comprising Si; n, v and w respectively represent positive numbers determined depending on valences of said rare earth element R, said metal element M, and said sintering aid component X, respectively; and 0.96≦m≦1.030, 0.05≦a≦3, 0.1≦b≦1.5, 0.1≦c≦1.0, 0.1≦d≦1.5, and 0.05≦e≦3.5. ### Claim 3 (depends on 2) The dielectric ceramic according to claim 2 wherein A is Ba and B is Ti. ### Claim 4 (depends on 2) The dielectric ceramic according to claim 2, wherein A is Ba and at least one of Ca and Sr. ### Claim 5 (depends on 2) The dielectric ceramic according to claim 2, wherein B is Ti and at least one of Zr and Hr. ### Claim 6 (depends on 2) The dielectric ceramic according to claim 2, wherein R comprises Dy. ### Claim 7 (depends on 2) The dielectric ceramic according to claim 2, wherein 0.9≦a≦2.8, 0.2≦b≦1.2, 0.2≦c≦0.7, 0.3≦d≦1.4, and 0.1≦e≦3. ### Claim 8 (depends on 7) The dielectric ceramic according to claim 7 wherein the average solid-solution region of said rare earth element R in a cross section of said crystal grains is 9% or less. ### Claim 9 (depends on 7) The dielectric ceramic according to claim 7 wherein A is Ba and B is Ti. ### Claim 10 (depends on 1) The dielectric ceramic according to claim 1 wherein A is Ba and B is Ti. ### Claim 11 (depends on 10) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 10. ### Claim 12 (depends on 9) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 9. ### Claim 13 (depends on 8) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 8. ### Claim 14 (depends on 7) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 7. ### Claim 15 (depends on 6) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 6. ### Claim 16 (depends on 5) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 5. ### Claim 17 (depends on 4) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 4. ### Claim 18 (depends on 3) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 3. ### Claim 19 (depends on 2) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 2. ### Claim 20 (depends on 1) A laminated ceramic capacitor having a ceramic sintered body comprising alternately stacked dielectric layers and internal electrode layers, a pair of external electrodes at different points on a surface of the ceramic sintered body, and each external electrode being electrically connected to a different internal electrode, wherein said dielectric layer is a dielectric ceramic according to claim 1.