# US 2010/0164604 A1 · Fuse circuit and layout designing method thereof > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2010/0164604 A1 - Document ID: US20100164604A1 - Status: Published application - Kind: A1 - Application number: 12/647,511 - Filed: 2009-12-27 - Published: 2010-07-01 - Earliest claimed: 2008-12-30 - Inventors: Jeong-Joo Park - Web page: https://patentgrep.com/patent/US20100164604A1 ## CPC - G11C 17/18: Auxiliary circuits, e.g. for writing into memory - H10W 20/493: {Fuses, i.e. interconnections changeable from conductive to non-conductive} - G11C: STATIC STORES (semiconductor memory devices H10B) - H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10 ## Abstract A fuse circuit for sensing a fuse connected state and layout designing method thereof are disclosed. Embodiments include a fuse program control unit providing a fuse open voltage in response to a program signal, a fuse cell unit configured to use a contact resistor connecting a node supplied with the fuse open voltage and a node supplied with a fuse connection voltage as a fuse, the fuse cell unit outputting a state information of the contact resistor in response to the fuse open voltage, and a fuse sensing unit outputting a fuse data signal corresponding to the state information of the contact resistor in response to a read signal. Accordingly, embodiments reduce a layout size of the fuse circuit. ## Claims ### Claim 1 An apparatus comprising: a fuse program control unit configured to provide a fuse open voltage in response to a program signal; a fuse cell unit configured to use a contact resistor connecting a node supplied with the fuse open voltage and a node supplied with a fuse connection voltage as a fuse, the fuse cell unit outputting state information of the contact resistor in response to the fuse open voltage; and a fuse sensing unit configured to output a fuse data signal corresponding to the state information of the contact resistor in response to a read signal. ### Claim 2 (depends on 1) The apparatus of claim 1, wherein if the fuse open voltage is supplied by the fuse program control unit, the fuse cell unit is floated. ### Claim 3 (depends on 2) The apparatus of claim 2, wherein if the fuse open voltage is not supplied by the fuse program control unit, the fuse cell unit provides the fuse connection voltage to the fuse sensing unit. ### Claim 4 (depends on 2) The apparatus of claim 2, wherein the contact resistor is formed of a material melted if the fuse open voltage is applied. ### Claim 5 (depends on 3) The apparatus of claim 3, wherein the fuse sensing unit outputs the fuse data signal corresponding to a logic level state of one of the fuse open voltage and the fuse connection voltage in response to the read signal. ### Claim 6 (depends on 1) The apparatus of claim 1, wherein the fuse open voltage corresponds to a voltage having a level at least equal to a power source voltage and wherein the fuse connection voltage corresponds to a ground voltage. ### Claim 7 An apparatus comprising: a fuse program control unit configured to provide a fuse open voltage in response to a program signal; a fuse cell unit configured to use a via resistor connecting a node supplied with the fuse open voltage and a node supplied with a fuse connection voltage as a fuse, the fuse cell unit outputting state information of the via resistor in response to the fuse open voltage; and a fuse sensing unit configured to output a fuse data signal corresponding to the state information of the via resistor in response to a read signal. ### Claim 8 (depends on 7) The apparatus of claim 7, wherein if the fuse open voltage is supplied by the fuse program control unit, the fuse cell unit is floated. ### Claim 9 (depends on 8) The apparatus of claim 8, wherein if the fuse open voltage is not supplied by the fuse program control unit, the fuse cell unit provides the fuse connection voltage to the fuse sensing unit. ### Claim 10 (depends on 8) The apparatus of claim 8, wherein the via resistor is formed of a material melted if the fuse open voltage is applied. ### Claim 11 (depends on 9) The apparatus of claim 9, wherein the fuse sensing unit outputs the fuse data signal corresponding to a logic level state of one of the fuse open voltage and the fuse connection voltage in response to the read signal. ### Claim 12 (depends on 8) The apparatus of claim 8, wherein the fuse open voltage corresponds to a voltage having a level at least as great as a power source voltage and wherein the fuse connection voltage corresponds to a ground voltage. ### Claim 13 A method comprising: forming an active region in a semiconductor; forming a first line for supplying a fuse open voltage and a second line for supplying a fuse connection voltage on the active region; forming a first contact as a fuse between the active region and the first line; and forming a second contact between the active region and the second line, wherein information for sensing a state of the fuse is outputted through the first line. ### Claim 14 (depends on 13) The method of claim 13, wherein the contact resistor is formed of a material melted if the fuse open voltage is applied to the first line. ### Claim 15 (depends on 13) The method of claim 13, wherein the active region is a p type active region formed in a p type well. ### Claim 16 (depends on 13) The method of claim 13, wherein the fuse open voltage corresponds to a voltage having a level equal to or greater than a power source voltage and wherein the fuse connection voltage corresponds to a ground voltage. ### Claim 17 A method comprising: forming a first line for supplying a fuse open voltage and a second line for supplying a fuse connection voltage in a semiconductor device; and forming a via as a fuse between the first line and the second line, wherein information for sensing a state of the fuse is outputted through the first line. ### Claim 18 (depends on 17) The method of claim 17, wherein the via is formed of a material melted if the fuse open voltage is applied to the first line. ### Claim 19 (depends on 17) The layout method of claim 17, wherein the fuse open voltage corresponds to a voltage having a level at least as great as a power source voltage. ### Claim 20 (depends on 17) The layout method of claim 17, wherein the fuse connection voltage corresponds to a ground voltage.