On-chip service processor
AssigneeOC Applications Research LLC
InventorsBulent Dervisoglu, Laurence H. Cooke, Vacit Arat
Life of this patent
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AssigneeOC Applications Research LLC
InventorsBulent Dervisoglu, Laurence H. Cooke, Vacit Arat
Estimating the term…
An integrated circuit is described that includes a stored program processor for test and debug of user-definable logic plus external interface between the test/debug circuits and the component pins. The external interface may be via an existing test interface or a separate serial or parallel port. Test and debug circuits may contain scan strings that may be used to observe states in user-definable logic or be used to provide pseudo-random bit sequences to user-definable logic. Test and debug circuits may also contain an on-chip logic analyzer for capturing sequences of logic states in user-definable circuits. Test and debug circuits may be designed to observe states in user-definable circuits during the normal system operation of said user-definable circuits.
-10. (canceled)
An integrated circuit comprising:
An integrated circuit comprising:
Dependencies are inferred from the claim text.