Semiconductor integrated circuit including transmitter and receiver which conducts loopback test and test method thereof
AssigneeNEC Electronics Corporation
InventorsShinya Konishi, Norio Arai
Life of this patent
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Abstract
A semiconductor integrated circuit includes an oscillation circuit for generating multiple clocks of mutually different phases, and is also characterized in selecting a single clock FCLK_P from among multiple clocks FCLK_P [n-1:0] for use in transmitting IQ Serial transmission signals and, utilizing the FCLK_P to transmit an IQ Serial transmission signal.
Claims9
A semiconductor integrated circuit comprising:
- an oscillation circuit for generating multiple clocks with mutually different phases,
- wherein a single clock is selected from the multiple clocks for use in sending a transmission signal, and the transmission signal is sent by utilizing the selected single clock.
A test method for a semiconductor integrated circuit including an oscillation circuit to generate multiple clocks of mutually different phases, a transmit circuit to send a transmission signal, and a receive circuit to receive the transmission signal sent by the transmit circuit during a loopback test operation, the method comprising:
- selecting a single clock from the multiple clocks for use in sending the transmission signal and, to send the transmission signal by utilizing the selected single clock;
- and
- performing a receive processing by utilizing the multiple clocks.
Dependencies are inferred from the claim text.