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US 2010/0149555 A1Published application
Method For Generating Alignment Marks
AssigneeCanon Kabushiki Kaisha
InventorsBrendon Yenson, Scott Alexander Rudkin
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AssigneeCanon Kabushiki Kaisha
InventorsBrendon Yenson, Scott Alexander Rudkin
Estimating the term…
A method (100), an apparatus (1100), and a computer program product are disclosed for generating alignment marks. A basis pattern (120) and a high frequency component (130) are combined (140). The basis pattern is defined such that a scaled and rotated version of the basis pattern correlated with the basis pattern is substantially equal to the auto-correlation of the basis pattern within a complex multiplicative constant. The high frequency component is of sufficient energy for cross correlation without detriment to the basis pattern. The basis pattern may be generated from a basis function, which may be a logarithmic radial harmonic function (LRHF). The combination is output as at least one alignment mark having an increased maximum frequency. The method (100) may further comprise printing the at least one alignment mark on a print medium.
A computer-implemented method for generating an alignment mark using a processor and a memory coupled to said processor, said method comprising the steps of:
An apparatus for generating an alignment mark, comprising:
A computer program product comprising a tangible computer readable medium having a computer program recorded thereon for execution by a computer to generate an alignment mark, said computer program product comprising
Dependencies are inferred from the claim text.