Structured Light Imaging System and Method
AssigneeFaro Technologies, Inc.
InventorYuri Malinkevich
Life of this patent
Estimating the term…
Abstract
A structured light imaging system for measuring coordinates of a surface may include a first imaging lens, a spatial light modulator provided after the first imaging lens, a second imaging lens provided after the spatial light modulator, and an imaging sensor provided after that second imaging light modulator. A method of measuring coordinates of a surface using a structured light imaging system may include illuminating the surface with structured light from a projector and adjusting light intensity at each pixel of the imaging system by using a feedback loop system such that each pixel of the imaging sensor will operate in a linear response range.
Claims14
A structured light imaging system for measuring coordinates of a surface by measuring reflected structured light projected onto the surface by a projector, the imaging system comprising:
- a first imaging lens;
- a spatial light modulator provided after the first imaging lens;
- a second imaging lens provided after the spatial light modulator;
- and
- an imaging sensor provided after the second imaging light modulator.
A method of measuring coordinates of a surface using a structured light imaging system, the method comprising:
- providing an imaging system comprising:
- a first imaging lens;
- a spatial light modulator provided after the first imaging lens;
- a second imaging lens provided after the spatial light modulator;
- and
- an imaging sensor provided after the second imaging light modulator illuminating the surface with structured light from a projector;
- and
- adjusting light intensity at each pixel of the imaging system by using a feedback loop system such that each pixel of the imaging sensor will operate in a linear response range.
Dependencies are inferred from the claim text.