Optical object measurement apparatus
AssigneeKowa Company, Ltd.
InventorsKoji Kobayashi, Naoki Kobayashi
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AssigneeKowa Company, Ltd.
InventorsKoji Kobayashi, Naoki Kobayashi
Estimating the term…
An optical object measurement apparatus includes a light source for generating a low-coherent light beam, which is swept via an array of pinholes on a Nipkow disk that rotates about an axis. A beam splitter splits the swept light beam into a probe light beam toward an object to be measured and a reference light beam toward a reference optical path. The probe light beam from the object and the reference light that has traveled along the reference optical path are combined in the beam splitter to produce interference light. A two-dimensional image-capturing device detects the interference light and produces a video signal to provide reflection intensity information of the interior of the object. This allows an interference optical system to be readily realized and tomographic images of an object to be observed at high levels of resolution and contrast.
An optical object measurement apparatus in which a predetermined area of an object to be measured is irradiated with a light beam from a light source, and optical interference is used to detect light reflected from the object in order to derive therefrom tomographic information of the object, the apparatus comprising:
An optical object measurement apparatus in which a predetermined area of an object to be measured is irradiated with a light beam from a light source, and optical interference is used to detect light reflected from the object in order to derive therefrom tomographic information of the object, the apparatus comprising:
An optical object measurement apparatus in which a predetermined area of an object to be measured is irradiated with a light beam from a light source, and optical interference is used to detect light reflected from the object in order to derive therefrom tomographic information of the object, the apparatus comprising:
An optical object measurement apparatus according to 10, wherein the pinhole means is a Nipkow disk that rotates around a predetermined axis and has a plurality of pinholes disposed in an array, and the light beam projected from the light source and the light beam received by the image-capturing means pass through regions on the disk that are geometrically symmetric with respect to the axis of rotation.
Dependencies are inferred from the claim text.