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US 2010/0149545 A1Published application
Apparatus and Method for Measuring Deformation of a Cantilever Using Interferometry
AssigneeUniversity College London
InventorsGabriel Aeppli, Benjamin Dueck
Life of this patent
Estimating the term…
Abstract
Apparatus and method for measuring the deformation of a tethered or untethered cantilever by projecting a radiation beam onto the cantilever, detecting an interference pattern reflected from or transmitted through the cantilever, and calculating the deformation of the cantilever by measuring the intensity variation within at least a portion of the interference pattern.
Claims22
1-23. (canceled)
An apparatus for measuring deformation of a cantilever, comprising:
- a projection system for projecting a radiation beam onto a cantilever;
- and
- a measurement system for detecting radiation transmitted through or reflected from said cantilever, wherein
- said projection system is arranged such that the radiation transmitted through or reflected from said cantilever forms an interference pattern;
- said measurement system is configured to measure the spatial variation in intensity within at least a portion of said interference pattern;
- and
- said apparatus further comprises a deformation calculating system for calculating a deformation of said cantilever from the spatial variation in intensity measured by said measurement system, wherein the deformation calculated from said spatial variation in intensity consists of a change in shape of the portion of the cantilever through or from which the radiation forming said interference pattern is transmitted or reflected.
4 more elements
A method of measuring deformation of a cantilever, comprising:
- projecting a radiation beam onto a cantilever;
- and
- detecting radiation transmitted through or reflected from said cantilever, wherein:
- said radiation beam is projected onto said cantilever in such a way as to form an interference pattern in said transmitted or reflected radiation;
- and
- said method further comprises:
- measuring the spatial variation in intensity within at least a portion of said interference pattern;
- and
- calculating a deformation of said cantilever from the measured spatial variation in intensity, wherein the deformation calculated from said spatial variation in intensity consists of a change in shape of the portion of the cantilever through or from which the radiation forming said interference pattern is transmitted or reflected.
6 more elements
Dependencies are inferred from the claim text.