Improved signal processing for optical computing system

A method for high-speed analysis of product samples during product processing, comprising:

• providing an illumination source;
• illuminating with a portion of the light from the illuminating source at least a portion of a product with light at an inspection point;
• providing first and second light sensitive detectors, the detectors producing output signals based on received light;
• directing a portion of the light from the illuminated product portion toward the first and second light sensitive detectors, the light from the illuminated product portion carrying information about the product portion;
• directing at least a portion of the light from the illumination source toward the first and second light sensitive detectors as a reference light;
• providing a temperature sensor in proximity to the first and second light sensitive detectors, the temperature sensor producing an output signal based on temperature;
• compensating the output signals produced by the first and second detectors based on the temperature output signal;
• and
• analyzing the compensated output signals produced by the first and second light sensitive detectors to determine temperature compensated illuminated product portion information.