Methods and apparatus for selecting settings for circuits
AssigneePrimarion, Inc.
InventorsKenneth A. Ostrom, Richard Pierson, Benjamim Tang, Clark Custer, Scott Southwell, Felix Kim
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AssigneePrimarion, Inc.
InventorsKenneth A. Ostrom, Richard Pierson, Benjamim Tang, Clark Custer, Scott Southwell, Felix Kim
Estimating the term…
Methods and apparatus selecting settings for circuits according to various aspects of the present invention may operate in conjunction with a measurement element connected to the circuit. The circuit may include a voltage source adapted to supply a voltage to the measurement element. The voltage may be substantially independent of the characteristics of the measurement element. The circuit may further include a measurement sensor responsive to a current in the measurement element. The measurement sensor may generate a control signal according to the current in the measurement element.
An integrated circuit adapted to operate in conjunction with a setting selected from a plurality of settings according to an external measurement element connected to a terminal of the integrated circuit, comprising:
A sensor circuit for selecting a function setting from multiple function settings for a component, wherein the function setting is specified according to a resistance of an external resistor connected to the component, comprising:
A method for selecting a setting for an integrated circuit adapted to operate in conjunction with a plurality of settings according to an external measurement element connected to a terminal of the integrated circuit including a functional module, comprising:
Dependencies are inferred from the claim text.