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US 2010/0148790 A1Published application
Method and device for characterising sensitivity to energy interactions in an electronic component
AssigneeEurpoean Aeronautic Defence and Space Company EADA France
InventorsFlorent Miller, Nadine Buard, Imad Lahoud, Thierry Carriere, Patrick Heins
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Abstract
To analyse an electric component in depth, provision is made to submit said component to focused laser radiation. It is shown that by modifying the altitude of the focus in the component, some internal parts of said component can be characterized more easily.
Claims9
Method for measuring sensitivity to energy interactions in an electronic component (1), in which
- the electronic component is activated,
- the electronic component thus activated is excited using (14) laser radiation (15),
- a malfunction of the activated electronic component corresponding to this excitation is measured (25), and
- a map (FIG. 5) is created of the locations of interest in the component where these interactions are strongest,
- characterized in that
- the laser radiation is focused (29) to various depths (31) in the component and
- the energy interactions for these different depths are measured.
4 more elements
Dependencies are inferred from the claim text.