Method and apparatus for indexing an adjustable test probe tip
AssigneeFluke Corporation
InventorsChris W. Lagerberg, Roger Stark
Life of this patent
Estimating the term…
Abstract
Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.
Claims22
A test probe, comprising:
- a conductive member having an electrically conductive tip defining an end;
- an insulative member surrounding at least a portion of the conductive member so that a first specific length of the conductive member is exposed from the insulative member;
- and
- a slide member coupled to the conductive member to move the conductive member relative to the insulative member from a first position to a second position so that a second specific length of the conductive member is exposed from the insulative member, the first position being different from the second position.
A test probe, comprising:
- an insulative member having an opening along its length;
- a conductive member having a first end defined by an electrically conductive tip, a portion of the conductive member positioned in the opening in the insulative member;
- and
- a slide member coupled to the conductive member operable to move the conductive member from a first length being exposed from the opening of the insulative member to a second length of the conductive member being exposed from the opening of the insulative member, the second length being a specific distance from the first length.
A test probe, comprising:
- a conductive member having an electrically conductive tip defining an end of the conductive member;
- an insulative member surrounding a first portion of the conductive member and the first end of the conductive member so that a second portion of the conductive member is exposed from the insulative member, the conductive member being operable to move relative to the insulative member;
- a locking mechanism that when locked prevents the conductive member from moving relative to the insulative member;
- and
- a label portion that corresponds to the length of the conductive member exposed from the insulative member.
A method for adjusting a length of a probe tip exposed from an insulative material, comprising:
- providing a first length of the probe tip exposed from the insulative material;
- and
- moving the probe tip so that a second length of the probe tip is exposed from the insulative material, the second length being a specific distance from the first length.
Dependencies are inferred from the claim text.