Noise measurement apparatus and test apparatus
AssigneeAdvantest Corporation
InventorToshiyuki OKAYASU
Life of this patent
Estimating the term…
Abstract
Provided is a noise measurement apparatus that measures noise at a location under measurement, comprising a self-excited oscillator that is provided at the location under measurement and that outputs an oscillation signal in which is sequentially accumulated, in each cycle, the noise at the location under measurement; a transmission path that transmits the oscillation signal output by the self-excited oscillator; and a measuring unit that measures noise added to the oscillation signal transmitted through the transmission path. The measuring unit may measure the noise at the location under measurement by differentiating noise added to the oscillation signal transmitted through the transmission path.
Claims21
A noise measurement apparatus that measures noise at a location under measurement, comprising:
- a self-excited oscillator that is provided at the location under measurement and that outputs an oscillation signal in which is sequentially accumulated, in each cycle, the noise at the location under measurement;
- a transmission path that transmits the oscillation signal output by the self-excited oscillator;
- and
- a measuring unit that measures noise added to the oscillation signal transmitted through the transmission path.
A noise measurement apparatus that measures noise distribution in a circuit substrate, comprising:
- a plurality of self-excited oscillators that are each provided at a different location under measurement in the circuit substrate, and that each output an oscillation signal in which is sequentially accumulated, in each cycle, the noise at the corresponding location under measurement;
- a transmission path that transmits the oscillation signal output by each self-excited oscillator;
- a measuring unit that measures noise added to each oscillation signal transmitted by the transmission path;
- and
- a distribution calculating section that calculates the noise distribution in the circuit substrate based on the noise in each oscillation signal measured by the measuring unit.
A noise measurement apparatus that measures noise of a device under test, comprising:
- a transmission path that transmits an oscillation signal output by a self-excited oscillator provided at a location under measurement in the device under test;
- and
- a measuring unit that measures noise at the location under measurement by differentiating noise added to the oscillation signal transmitted through the transmission path.
A test apparatus that tests a device under test, comprising:
- a noise measurement apparatus that measures noise at a predetermined location under measurement in the device under test;
- and
- a judging section that judges acceptability of the device under test based on the noise measured by the noise measurement apparatus, wherein the noise measurement apparatus includes:
- a self-excited oscillator that is provided at the location under measurement and outputs an oscillation signal in which is sequentially accumulated, in each cycle, the noise at the location under measurement;
- a transmission path that transmits the oscillation signal output by the self-excited oscillator;
- and
- a measuring unit that measures noise added to the oscillation signal transmitted by the transmission path.
A test apparatus that tests a device under test, comprising:
- a noise measurement apparatus that measures noise distribution in a circuit substrate of the device under test;
- and
- a judging section that judges acceptability of the device under test based on the noise distribution measured by the noise measurement apparatus, wherein the noise measurement apparatus includes:
- a plurality of self-excited oscillators that are each provided at a different location under measurement in the circuit substrate, and that each output an oscillation signal in which is sequentially accumulated, in each cycle, the noise at the corresponding location under measurement;
- a transmission path that transmits the oscillation signal output by each self-excited oscillator;
- a measuring unit that measures noise added to each oscillation signal transmitted by the transmission path;
- and
- a distribution calculating section that calculates noise distribution in the circuit substrate based on the noise in each oscillation signal measured by the measuring unit.
A test apparatus that measures a device under test, comprising:
- a noise measurement apparatus that measures noise at a predetermined location under measurement in the device under test;
- and
- a judging section that judges acceptability of the device under test based on the noise measured by the noise measurement apparatus, wherein the noise measurement apparatus includes:
- a transmission path that transmits an oscillation signal output by a self-excited oscillator provided at the location under measurement in the device under test;
- and
- a measuring unit that measures noise at the location under measurement by differentiating noise added to the oscillation signal transmitted through the transmission path.
Dependencies are inferred from the claim text.