High voltage semiconductor devices with schottky diodes
AssigneeVanguard International Semiconductor Corporation
InventorsShang-Hui Tu, Hung-Shern Tsai
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AssigneeVanguard International Semiconductor Corporation
InventorsShang-Hui Tu, Hung-Shern Tsai
Estimating the term…
High voltage semiconductor devices with Schottky diodes are presented. A high voltage semiconductor device includes an LDMOS device and a Schottky diode device. The LDMOS device includes a semiconductor substrate, a P-body region in a first region of the substrate, and an N-drift region in the second region of the substrate with a junction therebetween. A patterned isolation region defines an active region. An anode electrode is disposed on the P-body region. An N+-doped region is disposed in the N-drift region. A cathode electrode is disposed on the N+-doped region. The Schottky diode includes an N-drift region on the semiconductor substrate. The anode electrode is disposed on the N-drift region at the first region of the substrate. The N+-doped region is disposed on the N-drift region at the second region of the substrate. The cathode electrode is disposed on the N+-doped region.
1:
The high voltage semiconductor device as claimed in claim 1, wherein the semiconductor substrate comprises a single crystalline semiconductor substrate, an epitaxial semiconductor substrate, and a silicon-on-insulator (SOI) substrate.
The high voltage semiconductor device as claimed in claim 1, wherein the first device and the second device are neighboring along a longitudinal axis of the first electrode.
The high voltage semiconductor device as claimed in claim 1, wherein the first type doped-body region is a P-body region and the second type doped-drift region is an N-drift region.
The high voltage semiconductor device as claimed in claim 1, wherein the first electrode and the third electrode are electrically contacted.
The high voltage semiconductor device as claimed in claim 1, wherein the first device is a lateral diffused metal oxide semiconductor (LDMOS) device, and the second device is a Schottky diode.
The high voltage semiconductor device as claimed in claim 1, wherein the first electrode is an anode electrode and the second electrode is a cathode electrode.
The high voltage semiconductor device as claimed in claim 1, wherein in the second device, a Schottky junction exists between the first electrode and the second type doped-drift region.
The high voltage semiconductor device as claimed in claim 1, wherein the first type doped-body region is a ring shape doped region, and at the central region of the ring shape doped region, the isolation region defines the second type heavily doped region, wherein the ring shape doped region has two openings of the second type doped-drift regions.
A high voltage semiconductor device integrated with a Schottky diode, comprising:
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Dependencies are inferred from the claim text.