Gan-based field effect transistor
AssigneeFurukawa Electric Co., Ltd.
InventorsNomura Takehiko, Sato Yoshihiro, Kambayashi Hiroshi, Kaya Shusuke, Iwami Masayuki, Kato Sadahiro
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AssigneeFurukawa Electric Co., Ltd.
InventorsNomura Takehiko, Sato Yoshihiro, Kambayashi Hiroshi, Kaya Shusuke, Iwami Masayuki, Kato Sadahiro
Estimating the term…
A GaN-based field effect transistor (MOSFET) is comprised of a channel layer comprised of p-type GaN, an electron supply layer, a surface layer having band gap energy smaller than that of said electron supply layer, sequentially laminated on a substrate, and recess section is formed by removing a part of the drift layer, the electron supply layer, and the surface layer down to a depth that reaches to the channel layer. A source electrode and a drain electrode are formed so that the recess section positions between them, a gate insulation film is formed on the surface layer and on inner-surface of the recess section including the channel layer, and a gate electrode is formed on the gate insulating film in the recess section.
A GaN-based field effect transistor, comprising:
Dependencies are inferred from the claim text.