Device And Method For Analyzing A Sample

A device for analysing a sample surface comprising:

• an outlet and a frame,
• said outlet for forming a jet of Joule-Thomson cooling gas, said jet forming a sampling region for receiving one or more sample surfaces, and said frame holding said outlet and being adapted to receive a detector means, said detector means having an inlet;
• wherein said jet produces desorbed sample from said sample surfaces received in said sampling region, at least a portion of said desorbed sample being ionized to produce one or more sample ions, and said frame holds said outlet with respect to said sampling region and said inlet to allow said detector means to receive said sample ions and produce a signal indicative of the composition of said sample ions.

A device for analysing a sample surface comprising:

• an outlet, a detector means and a frame,
• said outlet for forming a jet of carbon dioxide, said jet forming a sampling region for receiving one or more sample surfaces, said detector means having an inlet and said frame holding said outlet and said detector means;
• wherein said jet produces desorbed sample from said sample surfaces received in said sampling region, at least a portion of said desorbed sample being ionized to produce one or more sample ions, and said frame holds said outlet with respect to said sampling region and said inlet to allow said detector means to receive said sample ions and produce a signal indicative of the composition of said sample ions.

A method of ionizing a sample comprising the steps of:

• providing an outlet, a detector and a frame, said outlet for forming a jet of carbon dioxide, said jet forming a sampling region for receiving one or more sample surfaces, said detector means having an inlet, and said frame holding said outlet and said detector means;
• positioning a sample in said sampling region,
• forming a jet of carbon dioxide such that said jet produces desorbed sample from said sample surfaces received in said sampling region, at least a portion of said desorbed sample being ionized to produce one or more sample ions, and said frame holds said outlet with respect to said sampling region and said inlet to allow said detector means to receive said sample ions and produce a signal indicative of the composition of said sample ions.

A device for analysing a sample surface comprising:

• an outlet and a frame,
• said outlet for forming a jet of gas, said jet forming a sampling region for receiving one or more sample surfaces, and said frame holding said outlet and being adapted to receive a detector means, said detector means having an inlet;
• wherein said jet produces desorbed sample from said sample surfaces received in said sampling region, at least a portion of said desorbed sample being ionized to produce one or more sample ions, and said frame holds said outlet with respect to said sampling region and said inlet to allow said detector to receive said sample ions and produce a signal indicative of the composition of said sample ions.

A device for analysing a sample surface comprising:

• an outlet and a frame,
• said outlet for forming a gas jet, said jet forming a sampling region for receiving one or more sample surfaces, and said frame holding said outlet and being adapted to receive a detector means, said detector means having an inlet;
• wherein said jet produces desorbed sample from said sample surfaces received in said sampling region, and said frame holds said outlet with respect to said sampling region and said inlet to allow said detector to receive said desorbed sample and produce a signal indicative of the composition of said sample.