Electronic device test apparatus and method of testing electronic devices
AssigneeAdvantest Corporation
InventorsAkihiko Ito, Koya Karino, Yoshihito Kobayashi
Life of this patent
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Abstract
An electronic device test apparatus used for bringing the ICs into electrical contact with contact parts of the test head in the state where the ICs are held on a test tray and running tests on the electrical characteristics of ICs, the electronic device test apparatus including an inversion system for rotating the test tray which holds a plurality of ICs in a direction dropping ICs which are insufficiently held at least once before testing.
Claims12
An electronic device test apparatus used for bringing devices under test into electrical contact with contact parts of the test head in the state where the devices under test are held on a test tray, and running tests on the electrical characteristics of the devices under test,
- the electronic device test apparatus comprising:
- a posture changer configured to change a posture of the test tray which holds the devices under test in a direction dropping devices under test which are insufficiently held at least once before testing.
A method of testing electronic devices bringing devices under test into electrical contact with contact parts of the test head in the state where the devices under test are held on a test tray, and running tests on the electrical characteristics of the devices under test,
- the method of testing electronic devices comprising:
- changing a posture of the test tray which holds the devices under test in a direction dropping devices under test which are insufficiently held at least once before testing.
Dependencies are inferred from the claim text.