Self-calibration systems and methods
AssigneesGeorgia Tech Research Corporation, University of Florida Research Foundation, Inc.
InventorsDong Hoon Han, Abhijit Chatterjee, Selim Sermet Akbay, Soumendu Bhattacharya, William R. Eisenstadt
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Abstract
Various embodiments of self-calibration systems and methods are described. One method embodiment, among others, includes imposing an alternate test to components within the device, responsive to the imposition of the alternate test, providing test responses corresponding to the components, and substantially, simultaneously mapping each of the test responses to corresponding specification values of the components.
Claims21
A self-calibration method implemented internally to a device, comprising:
- imposing an alternate test to components within the device;
- responsive to the imposition of the alternate test, providing test responses corresponding to the components;
- and
- substantially simultaneously mapping each of the test responses to corresponding specification values of the components.
A self-calibration system implemented internally to a device, comprising:
- a processor internal to the device, the processor configured to impose a test stimulus to a plurality of components within the device;
- at least one sensor internal to the device, the at least one sensor configured to provide a test response corresponding to a reaction by the plurality of components to the test stimulus;
- compensation circuitry coupled to at least one of the plurality of components;
- wherein the processor is further configured to predict at least one specification value based on the test response corresponding to the reaction of the plurality of components, and determine, based on the at least one specification value, whether to signal to the compensation circuitry to adjust the at least one specification value of the plurality of components.
(canceled)
(canceled)
A self-calibration system implemented internally to a system on a chip, comprising:
- means for imposing an alternate test to components within the system on the chip;
- means for, responsiveness to the imposition of the alternate test, providing test responses corresponding to the components;
- means for substantially simultaneously mapping each of the test responses to corresponding specification values of the components;
- and
- means for performing compensation to adjust one or more of the specification values of one or more of the components while considering how compensation affects all of the specification values.
Dependencies are inferred from the claim text.