System and method for correcting sampling errors associated with radiation source tuning rate fluctuations in swept-wavelength interferometry

A swept wavelength interferometer system, comprising:

• an electromagnetic radiation source for directing incident electromagnetic radiation over a range of wavelengths to a splitter, wherein the splitter routes a portion of the incident electromagnetic radiation along a first radiation path and another portion of the incident electromagnetic radiation is routed along a second radiation path;
• a first interferometer coupled to the splitter along the first path, wherein a first detector measures one or more characteristics of the incident electromagnetic energy along the first radiation path;
• a second interferometer coupled to the splitter along the second path, wherein a second detector measures one or more characteristics of the incident electromagnetic radiation along the second radiation path, wherein the first detector provides a trigger signal used to sample electromagnetic radiation detected by the second detector;
• a data acquisition module coupled to the first detector and second detector for storing information received from the first detector and the second detector;
• and
• an electronic delay element coupled to the data acquisition module to correct sampling errors based at least in part on a differential delay associated with the electromagnetic radiation traversing the first radiation path and the second radiation path.

A method of correcting sampling errors due to electromagnetic radiation tuning fluctuation in a swept-wavelength interferometry system, the method comprising:

• calculating a first delay period between a trigger event and an acquisition event in a swept-wavelength interferometry system having an electromagnetic radiation source for directing electromagnetic radiation over a range of wavelengths, wherein the trigger event occurs on a first radiation path and the acquisition event occurs on a second radiation path;
• calculating a second delay period in the swept-wavelength interferometry system, wherein the second delay period includes a difference induration time for the electromagnetic radiation to traverse the first radiation path and the second radiation path;
• and
• inserting a delay element in the first radiation path or the second radiation path to correct for sampling errors, wherein the delay element is configured to account for the first delay period and the second delay period.

A method of correcting sampling errors due to electromagnetic radiation tuning fluctuation in a swept-wavelength interferometry system, the method comprising:

• calculating a first delay period between a trigger event and an acquisition event in a swept-wavelength interferometry system having an electromagnetic radiation source for directing electromagnetic radiation over a range of wavelengths, wherein the trigger event occurs on a first radiation path and the acquisition event occurs on a second radiation path;
• calculating a second delay period in the swept-wavelength interferometry system, wherein the second delay period includes a duration of time for the electromagnetic radiation to traverse the first radiation path and the second radiation path;
• storing the one or more trigger events and data acquisition events in a data acquisition module;
• inserting an electronic delay element in the data acquisition module, such that the trigger events and the data acquisition events are stored in a manner to account for correction for sampling errors associated with the first delay period and the second delay period.

A method of correcting sampling errors due to electromagnetic radiation fluctuation in swept-wavelength interferometry, the method comprising:

• outputting electromagnetic radiation over a range of wavelengths by an electromagnetic source;
• splitting the electromagnetic radiation into a first radiation path for generating a trigger signal and a second radiation path for sampling data;
• and
• calculating a differential delay period to correct sampling errors associated with the first radiation path and the second radiation path;
• inserting a delay element in at least one of the first radiation path or the second radiation path to account for the differential delay period;
• and
• storing the trigger signal and the sampling data in a manner to account of the differential delay period.