Flow controller, flow measuring device testing method, flow controller testing system, and semiconductor manufacturing apparatus
AssigneeHORIBA STEC, Co., Ltd.
InventorTadahiro Yasuda
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AssigneeHORIBA STEC, Co., Ltd.
InventorTadahiro Yasuda
Estimating the term…
A testing method for testing a flow controller with high accuracy by shortening as much as possible the time required for the test including the wait time. A testing-subject flow controller and a testing-standard flow controller are arranged in that order in series from the upstream side in a flow channel through which a fluid whose flow is to be controlled flows. In a flow-uncontrolled state in which the valve of the testing-subject flow controller is practically in the full-open state, and with the fluid flow controlled to a predetermined flow rate by the testing-standard flow controller, whether the actual flow-rate measurement according to the testing-subject flow controller falls within a predetermined range of actual flow-rate measurements according to the testing-standard flow controller is determined.
A method for testing a flow controller comprising a valve, a flow measuring section for measuring the flow rate of a fluid passing the valve, and a valve control mechanism for controlling the valve so as to make the actual flow-rate measurement determined in the flow measuring section be an assigned target flow rate, the flow controller testing method comprising:
A system for testing a flow controller comprising a valve, a flow measuring section for measuring the flow rate of a fluid passing the valve, and a valve control mechanism for controlling the valve so as to make the actual flow-rate measurement determined in the flow measuring section be an assigned target flow rate, the flow controller testing system comprising:
A semiconductor manufacturing apparatus for testing a flow controller comprising a valve, a flow measuring section for measuring the flow rate of a fluid passing the valve, and a valve control mechanism for controlling the valve so as to make the actual flow-rate measurement determined in the flow measuring section be an assigned target flow rate, the semiconductor manufacturing apparatus comprising:
A flow-rate testing device testing method of utilizing a testing-standard flow controller comprising a valve, a flow measuring section for measuring the flow rate of a fluid passing the valve, and a valve control mechanism for controlling the valve so as to make the actual flow-rate measurement determined in the flow measuring section be an assigned target flow rate, to test a testing-subject flow rate measuring device furnished with a flow measuring section for measuring fluid flow rates, the flow-rate testing device testing method comprising:
Dependencies are inferred from the claim text.