Test apparatus and test method
AssigneeAdvantest Corporation
InventorsShinichi ISHIKAWA, Masaru GOISHI, Hiroyasu Nakayama, Masaru Tsuto
Life of this patent
Estimating the term…
Loading patent…
AssigneeAdvantest Corporation
InventorsShinichi ISHIKAWA, Masaru GOISHI, Hiroyasu Nakayama, Masaru Tsuto
Estimating the term…
There is provided a test apparatus for testing at least one device under test, including a packet list storing section that stores a plurality of packet lists each of which includes a series of packets communicated between the test apparatus and the at least one device under test, a flow control section that designates an order of executing the plurality of packet lists in accordance with an execution flow of a test program that is designed to test the at least one device under test, and a packet communicating section that sequentially communicates the series of packets included in packet lists sequentially designated by the flow control section between the test apparatus and the at least one device under test, to test the at least one device under test.
A test apparatus for testing at least one device under test, comprising:
A test method for testing at least one device under test, comprising:
Dependencies are inferred from the claim text.