Test apparatus and test method
AssigneeAdvantest Corporation
InventorsMASARU GOISHI, HIROYASU NAKAYAMA, MASARU TSUTO
Life of this patent
Estimating the term…
Abstract
Provided is a test apparatus that tests a device under test, comprising an upper sequencer that sequentially designates packets transmitted to and from the device under test, by executing a test program for testing the device under test; a packet data sequence storing section that stores a data sequence included in each of a plurality of types of packets; and a lower sequencer that reads, from the packet data sequence storing section, a data sequence of a packet designated by the upper sequencer and generates a test data sequence used for testing the device under test.
Claims13
A test apparatus that tests a device under test, comprising:
- an upper sequencer that sequentially designates packets transmitted to and from the device under test, by executing a test program for testing the device under test;
- a packet data sequence storing section that stores a data sequence included in each of a plurality of types of packets;
- and
- a lower sequencer that reads, from the packet data sequence storing section, a data sequence of a packet designated by the upper sequencer and generates a test data sequence used for testing the device under test.
A method for testing a device under test with a test apparatus, comprising:
- providing the test apparatus with an upper sequencer and a lower sequencer;
- causing the upper sequencer to sequentially designate packets transmitted to and from the device under test, by executing a test program for testing the device under test;
- and
- causing the lower sequencer to read, from a packet data sequence storing section storing a data sequence included in each of a plurality of types of packets, a data sequence of a packet designated by the upper sequencer and generate a test data sequence used for testing the device under test.
Dependencies are inferred from the claim text.