Programming method to reduce gate coupling interference for non-volatile memory
AssigneeMicron Technology, Inc.
InventorSeiichi Aritome
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AssigneeMicron Technology, Inc.
InventorSeiichi Aritome
Estimating the term…
A non-volatile memory device and programming process is described that compensates for coupling effects on threshold gate voltages of adjacent floating gate or non-conductive floating node memory cells by adjusting the threshold voltage level programmed in view of the data being programmed on a following programming cycle into adjacent memory cells, so that the coupling effect results in the desired target threshold voltages for the cells. In one embodiment of the present invention, memory cell coupling is compensated for by adjusting programming level of one or more memory cells of a first page a memory array to a higher or lower threshold verify target voltage given the data/programming level to be written to directly adjacent memory cells of a second page, so that coupling between the directly adjacent memory cells of the first and second pages brings the memory cells of first page to their final target programming level.
A method of programming a selected memory cell of an array of memory cells to a desired programming state, the method comprising:
A method of programming memory cells of a memory array, the method comprising:
A method of compensating for programming interference effects in a memory device comprising an array of memory cells, the method comprising:
A method of programming memory cells of an array of memory cells, the method comprising:
Dependencies are inferred from the claim text.