Device including a contact detector

A method of obtaining an electrical property of a test sample, said method comprising:

• (a) providing said test sample, said test sample defining a test surface,
• (b) providing a test apparatus including a probe for determining an electrical property of an area of a surface of a test sample, said probe intended to be in a specific orientation relative to said test sample, said probe comprising:
• a supporting body defining a first surface,
• a plurality of cantilever arms extending from said supporting body in co-planar relationship with said first surface, said plurality of cantilever arms extending substantially parallel to each other, each of said plurality of cantilever arms including an electrical conductive tip for contacting said area of said test sample by movement of said probe relative to said surface of said test sample into said specific orientation, and
• a contact detector extending from said supporting body arranged so as to contact said surface of said test sample prior to or simultaneously with any one of said plurality of cantilever arms contacting said surface of said test sample when performing said movement,
• said apparatus further comprising an electrical signal generator electrically connected to said electrical conductive tips of said probe,
• (d) providing a contact detection circuit electrically connected to said contact detector,
• (e) moving said probe relative to said surface of said test sample, and
• (f) monitoring said contact detection circuit for indication of said contact detector being in contact with said surface of said test sample, where said contact detector is a strain gauge sensor comprising:
• a flexible arm having a base split into two anchoring arms, and
• an electrical pathway of a non-piezoresistive material going out through one of said anchoring arms to said flexible arm and back through the other of said anchoring arms.

A system for determining an electrical property of an area of a surface of a test sample, said system comprising:

• a test sample holder for holding said test sample,
• a probe holder for holding a probe for determining an electrical property of an area of a surface of a test sample, said probe intended to be in a specific orientation relative to said test sample, said probe comprising:
• a supporting body defining a first surface,
• a plurality of cantilever arms extending from said supporting body in co-planar relationship with said first surface, said plurality of cantilever arms extending substantially parallel to each other, each of said plurality of cantilever arms including an electrical conductive tip for contacting said area of said test sample by movement of said probe relative to said surface of said test sample into said specific orientation, and
• a contact detector extending from said supporting body arranged so as to contact said surface of said test sample prior to or simultaneously with any one of said plurality of cantilever arms contacting said surface of said test sample when performing said movement,
• said system further comprising an electrical signal generator electrically connected to said electrical conductive tips of said probe, and a contact detection circuit electrically connected to said contact detector,
• wherein the movement of said probe relative to said surface of said test sample said contact detection circuit detects an indication of said contact detector being in contact with said surface of said test sample, wherein said contact detector is a strain gauge sensor comprising:
• a flexible arm having a base split into two anchoring arms, and
• an electrical pathway of a non-piezoresistive material going out through one of said anchoring arms to said flexible arm and back through the other of said anchoring arms.