Extreme ultraviolet light source apparatus
AssigneeGigaphoton Inc.
InventorsTakashi SUGANUMA, Masato MORIYA, Tamotsu ABE, Kouji KAKIZAKI, Osamu WAKABAYASHI
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AssigneeGigaphoton Inc.
InventorsTakashi SUGANUMA, Masato MORIYA, Tamotsu ABE, Kouji KAKIZAKI, Osamu WAKABAYASHI
Estimating the term…
An extreme ultraviolet (EUV) light source apparatus in which a location or posture shift of an EUV collector mirror can be detected. The apparatus includes: a chamber; a target supply mechanism for supplying a target material into the chamber; a driver laser for irradiating the target material with a laser beam to generate plasma; a collector mirror having a first focal point and a second focal point, for reflecting light, which is generated at the first focal point, toward the second focal point; a splitter optical element provided in an optical path of the light reflected by the collector mirror, for splitting a part of the light reflected by the collector mirror; and an image sensor provided in an optical path of the light split by the splitter optical element, for detecting a profile of the light split by the splitter optical element.
An extreme ultraviolet light source apparatus for generating extreme ultraviolet light by irradiating a target material with a laser beam to turn the target material into plasma, said apparatus comprising:
An extreme ultraviolet light source apparatus for generating extreme ultraviolet light by irradiating a target material with a laser beam to turn the target material into plasma, said apparatus comprising:
Dependencies are inferred from the claim text.