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US 2010/0138915 A1Published application
Password Protected Built-In Test Mode For Memories
AssigneeMicron Technology, Inc.
InventorsAntonino La Malfa, Marco Messina
Life of this patent
Estimating the term…
Abstract
In accordance with some embodiments, a semiconductor memory may be provided with a built-in test mode that is accessible through a password protection scheme. This enables access to a built-in test mode after manufacturing, if desired. At the same time, the password protection prevents use of the built-in test mode to bypass security features of the memory.
Claims14
A method comprising:
- providing for password protected access to a built-in test mode of a semiconductor memory.
A semiconductor memory comprising:
- a controller;
- a memory array coupled to said controller;
- a configuration memory coupled to said controller;
- and
- an interface for implementing a built-in test mode, said interface to implement a password protection access to said built-in test mode.
2 more elements
A semiconductor memory device comprising:
- a memory array;
- and
- a control to selectively implement a password protected test mode for said memory.
Dependencies are inferred from the claim text.