Method of measuring physical property values of cell and physical property measuring apparatus
AssigneeSony Corporation
InventorsYoichi Katsumoto, Yoshihito Hayashi
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AssigneeSony Corporation
InventorsYoichi Katsumoto, Yoshihito Hayashi
Estimating the term…
Firstly, a shape of a cell as an object of a measurement is modeled, and a complex electric permittivity response when an AC electric field is applied to the cell is obtained through a numerical analysis (Step S1). A numerical calculation is carried out based on that result while values of a membrane capacitance Cm and a cell cytoplasm electric conductivity κi are changed, thereby calculating a dielectric spectrum (Step S2). The dielectric spectrum thus calculated is revolved to a dielectric relaxation expression, thereby obtaining a rise Δε in relative electric permittivity and relaxation time τ (Step S3). Next, dependency of (Δε, τ) on (Cm, κi) is obtained, thereby creating a regression expression corresponding to the shape of the cell as the object of the measurement (Step S4). A dielectric spectrum of the cell is actually measured, and the resulting values actually measured and the regression expression are compared with each other, thereby obtaining a membrane capacitance Cm, exp and a cell cytoplasm electric conductivity κi, exp of the cell as the object of the measurement (Step 5).
A method of measuring physical property values of a cell having:
A physical property measuring apparatus having:
Dependencies are inferred from the claim text.