Non-contact probe
AssigneeRenishaw PLC
InventorsNicholas John Weston, Yvonne Ruth Huddart
Life of this patent
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Abstract
A non-contact measurement apparatus and method. A probe is provided for mounting on a coordinate positioning apparatus, comprising at least one imaging device for capturing an image of an object to be measured. Also provided is an image analyser configured to analyse at least one first image of an object obtained by the probe from a first perspective and at least one second image of the object obtained by the probe from a second perspective so as to identify at least one target feature on the object to be measured. The image analyser is further configured to obtain topographical data regarding a surface of the object via analysis of an image, obtained by the probe, of the object on which an optical pattern is projected.
Claims17
A non-contact measurement apparatus, comprising:
- a probe for mounting on a coordinate positioning apparatus, comprising at least one imaging device for capturing an image of an object to be measured;
- an image analyser configured to analyse at least one first image of an object obtained by the probe from a first perspective and at least one second image of the object obtained by the probe from a second perspective so as to identify at least one target feature on the object to be measured, and further configured to obtain topographical data regarding a surface of the object via analysis of at least one image, obtained by the probe, of the object on which an optical pattern is projected.
A non-contact method for measuring an object located within a measurement space using a probe comprising at least one imaging device, the method comprising:
- the probe obtaining a plurality of images of the object, comprising at least one image of the object from a first perspective, at least one image of the object from a second perspective, and at least one image of the object on which an optical pattern is projected;
- analysing the plurality of images to identify at least one target feature on the object to be measured and to obtain topographical data regarding a surface of the object via analysis of the optical pattern.
Dependencies are inferred from the claim text.