X-ray inspection device and production system
AssigneeIshida Co., Ltd.
InventorsTakashi Kabumoto, Osamu Hirose
Life of this patent
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AssigneeIshida Co., Ltd.
InventorsTakashi Kabumoto, Osamu Hirose
Estimating the term…
An X-ray inspection device includes a conveying unit, an identification part, and an operation control part. The X-ray inspection device irradiates articles with X-rays while the article is being conveyed, and the article is inspected. The conveying unit is configured and arranged to convey the article. The identification part is configured and arranged to identify whether the article is a test piece or an end product. The operation control part is configured to set operation of the X-ray inspection device to a normal mode in which the article is determined to be defective or not defective when the article has been identified as an end product by the identification part, and to a test mode in which a state of the device is assessed when the article has been identified as a test piece by the identification part.
An X-ray inspection device for irradiating an article with X rays and inspecting the article while the article is being conveyed, the X-ray inspection device comprising:
Dependencies are inferred from the claim text.