Spectroscopic imaging method and system for exploring the surface of a sample

Spectroscopic imaging system for exploring the surface of a sample comprising:

• a microscopic or macroscopic device including an objective,
• a housing including a spectroscope, said spectroscope comprising:
• an excitation source able to generate an excitation beam incident to the sample surface, producing an emitted light,
• collecting means able to collect the emitted light to form an emitted light beam having an energy,
• detection means able to measure the energy of the emitted light beam in order to obtain a spectroscopic image of the sample surface, said detection means comprising at least one line of pixels, and
• scanning means disposed between the objective of the microscopic or macroscopic device and the spectroscope, said scanning means being disposed in the optical path of the excitation beam and being able to scan the sample surface in two directions X and Y in order to illuminate a scanned area on the sample surface, wherein:
• during the scanning of the excitation beam on the scanned area, the energy of the emitted light beam measured on the scanned area is integrated on the pixels of one or more lines of pixels of the detection means, generating average spectral data for said lines of pixels,
• storage means are connected to the detection means, said average spectral data of each line of pixels being transferred toward the storage means, and said storage means comprising a memory able to store average spectral data of M lines of pixels, and
• an imaging device is connected to the storage means, said average spectral data of M lines of pixels being send simultaneously toward said imaging device in order to obtain an average spectroscopic image of the scanned area.