Image synthesis apparatus and method supporting measured materials properties
AssigneeElectronics and Telecommunications Research Institute
InventorsJoo-Haeng LEE, Sung-Soo Kim, Seung Woo Nam
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AssigneeElectronics and Telecommunications Research Institute
InventorsJoo-Haeng LEE, Sung-Soo Kim, Seung Woo Nam
Estimating the term…
An image synthesis apparatus supporting measured materials properties includes an input unit for receiving from a user selected information on material information processing, sampling and rendering; a material information processing unit for converting measured material data into raw material data, performing material model fitting on the raw material data to generate material information and performing material mixing on the material information to generate mixed material information, wherein the model fitting and the material mixing is performed according to the selected information; and a sampling unit for sampling the raw material data to generate sampling information. The apparatus further includes a materials properties rendering unit for rendering scene information contained in the selected information, the mixed material information and the sampling information to generate surface material information; and an output unit for visualizing the material information and the surface material information.
An image synthesis apparatus supporting measured materials properties, the apparatus comprising:
An image synthesis method supporting measured materials properties, the method comprising:
Dependencies are inferred from the claim text.