US 2010/0134136 A1Published application

Operating method of test handler

AssigneeTechwing Co., Ltd.

InventorsYun Sung Na, In Gu Jeon, Dong Hyun Yo, Hyun Song

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Abstract

Operation methods of test handler are disclosed. The pick-and-place apparatus picks up semiconductor devices from first loading compartments arrayed in a matrix on a first loading element, moves, and places onto second loading compartments arrayed in a matrix on a second loading element. Pickers of the pick-and-place apparatus pick up the semiconductor devices from the first loading compartments and place them selectively onto a plurality of adjacent odd rows or a plurality of adjacent even rows of the second loading compartments during one operation. The pick-and-place apparatus includes a relatively large number of the pickers, preferably arrayed in a matrix, and thus performs loading and unloading of semiconductor devices at a relatively high speed.

An operation method of a test handler, the method comprising:

(a) loading semiconductor devices from a customer tray located on a loading plate onto a test tray located at a loading position;
(b) assisting a tester to test the semiconductor devices, loaded onto the test tray, at a test position, after moving the test tray to the test position;
and
(c) unloading the tested semiconductor devices from the test tray located at an unloading position onto another customer tray located on an unloading plate, after moving the test tray to the unloading position,
wherein the step (c) includes the steps of:
(c1) picking up the semiconductor devices from the test tray by a sorting pick-and-place apparatus having pickers arrayed in a 2×N matrix (n is an integer), M×N matrix (M and N are an integer which is larger than 1) in which a pitch between the 1st and 2nd rows of the pickers is fixed to be identical to a spacing between rows of placing compartments of the test tray and a pitch between columns of the pickers is regulated to be identical to a spacing between columns of the placing compartments of the test tray and a spacing between columns of the loading compartments of the customer tray;
(c2) regulating the pitch between the columns of the pickers of the sorting pick-and-place apparatus to the spacing between the columns of the loading compartments of the customer tray;
(c3) moving, sorting, and placing the semiconductor devices onto a sorting table having sorting-placing compartments, according to the test result of the tester, in which a spacing between odd rows of the sorting-placing compartments and a spacing between even rows of the sorting-placing compartments are identical to the spacing between the rows of the placing compartments of the test tray and a spacing between columns of the sorting-placing compartments is identical to the spacing between the columns of the loading compartments of the customer tray;
and
(c4) moving and placing the semiconductor devices from the sorting table onto the customer tray by an unloading pick-and-place apparatus.

7 more elements

Abstract

Claims5