Semiconductor device test apparatus

Abstract

A semiconductor device test apparatus may include a test handler using a customer tray and a test tray to sequentially transport a plurality of semiconductor devices to a loading part, a soak part, a test part, a desoak part, and an unloading part; and a test head electrically connected to the semiconductor devices in the test tray disposed in the test part to test electrical characteristics of the semiconductor devices. The test part is provided in the test handler such that the test tray is on an upper surface of the test handler. The test head is provided above the test handler such that a lower surface thereof having a test socket provided thereon faces the test part. The semiconductor devices in the test tray disposed in the test part of the test handler are electrically connected to the test socket by a downward movement of the test head.

Dependencies are inferred from the claim text.