Microcircuit testing interface having kelvin and signal contacts within a single slot
AssigneeJohnstech International Corporation
InventorJeffrey C. Sherry
Life of this patent
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Abstract
In a first slot of a plurality of adjacent slots in alignment with traces on a load board of a tester, first and second conductor layers, each to make electrical contact with both a load board trace and a DUT lead. Each of the first and second contacts receives force from a resilient element extending across the slots and that urges a contact point on the contact against at least one trace and a DUT lead. Insulation between said first and second contacts in the first slot electrically insulates the first and second contacts from each other within the first slot.
Claims10
In a microcircuit test interface of the type having i) a load board supporting a plurality of traces arranged in a predetermined pattern and for connection to circuitry for testing operation of a microcircuit comprising a device under test (DUT), ii) a test contact guide having a plurality of adjacent planar slots in alignment with the traces, each for receiving a contact element for electrically connecting a lead on a DUT to a trace on a load board, and iii) a resilient element within the slots, wherein the invention comprises in a first slot and slidable therein, first and second conductor layers each to make electrical contact with both a load board trace and a DUT lead, each of the first and second contacts receiving force from the resilient element urging a contact point on the contact against at least one of a trace and a DUT lead, and insulation between said first and second contacts in the first slot electrically insulating the first and second contacts from each other within the first slot.
The test interface of claim, wherein the contact pad is on an edge of the first contact in facing and adjacent relation to the resilient member.
Dependencies are inferred from the claim text.