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AssigneeShimadzu Corporation
InventorAtsushi Ohtani
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A discrimination parameter calculation method for photon detectors in this invention, applies two types of fitting functions which approximate waveforms of count numbers relative to energy ratios to the data having accumulated output waveform signals, and calculates fitting parameters of both the fitting functions. Based on both the fitting parameters, count numbers which are 1/n of peaks of both the fitting functions, and a value of the energy ratio of both the fitting functions corresponding to the count numbers is calculated as discrimination parameter k. Thus, whatever kind first photon detecting elements 35 and second photon detecting elements 37 may be, since discrimination parameter k is automatically calculated based on the fitting parameters after carrying out a fitting with the fitting functions, the discrimination parameter can be calculated with high accuracy. It is therefore possible to obtain relatively easily discrimination parameter k which can fully bring out performance of the photon detectors 17.
A discrimination parameter calculation method for photon detectors, in which the photon detectors having multiple layers of photon detecting elements of different types located opposite a light source and in a back side, for calculating a discrimination parameter for carrying out pulse shape discrimination of output waveform signals, and determining photon detecting elements having carried out an interaction with photons, the discrimination parameter calculation method comprising a step of applying to data having accumulated the output waveform signals, two types of fitting functions which approximate waveforms of count numbers relative to energy ratios;
A nuclear medicine diagnostic apparatus for detecting photons from a patient, comprising a bed for supporting the patient;
Dependencies are inferred from the claim text.