Plasma etching apparatus
AssigneeTokyo Electron Limited
InventorsRyoichi YOSHIDA, Tetsuo YOSHIDA, Michishige SAITO, Toshikatsu WAKAKI, Hayato AOYAMA, Akira OBI, Hiroshi SUZUKI
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AssigneeTokyo Electron Limited
InventorsRyoichi YOSHIDA, Tetsuo YOSHIDA, Michishige SAITO, Toshikatsu WAKAKI, Hayato AOYAMA, Akira OBI, Hiroshi SUZUKI
Estimating the term…
A plasma etching method by using a plasma etching apparatus having a depressurizable processing chamber; a lower electrode for mounting thereon a substrate to be processed in the processing chamber; an upper electrode facing the lower electrode in the processing chamber with a plasma generation region formed therebetween; a radio frequency power supply unit for applying a radio frequency power between the upper electrode and the lower electrode to thereby form a radio frequency electric field in the plasma generation region, the method comprising: supplying a first gas including etchant gas to an upper gas inlet to introduce the first gas through the upper electrode into the plasma generation region; and feeding a second gas including dilution gas to a side gas inlet to introduce the second gas through a sidewall of the processing chamber into the plasma generation region.
A plasma etching method by using a plasma etching apparatus having a depressurizable processing chamber;
A plasma etching method by using a plasma etching apparatus having a depressurizable processing chamber;
A plasma etching method by using a plasma etching apparatus having a depressurizable processing chamber;
Dependencies are inferred from the claim text.