Model-based dissimilarity indices for health monitoring systems
AssigneeThe Boeing Company
InventorV. John Mathews
Life of this patent
Estimating the term…
Abstract
A method, apparatus, and computer program product for identifying dissimilarity indices for a structure is presented. A first test signal is sent into a baseline model of the structure. An estimated response signal to the first test signal sent into the baseline model of the structure is received. A second test signal is sent into the structure. A second response single to the second test signal is received. A value is assigned to a model-based dissimilarity index using the first response compared to the second response.
Claims22
A method for identifying dissimilarity indices for a structure, the method comprising:
- sending a first test signal into a baseline model of the structure;
- receiving a first response signal to the first test signal sent into the baseline model of the structure;
- sending a second test signal into the structure;
- receiving a second response signal to the second test signal sent into the structure;
- assigning a value to a dissimilarity index using the first response signal, the second response signal, and a dissimilarity index equation;
- and
- transforming the dissimilarity index to become at least substantially independent of a length of a path between a transmitter and a sensor.
(canceled)
An apparatus comprising:
- a structure having a plurality of components;
- a set of transmitters physically associated with the plurality of components, wherein the set of transmitters is configured to send signals into the plurality of components;
- a set of sensors physically associated with the plurality of components, wherein the set of sensors is configured to detect responses to the signals;
- and
- a structural health monitoring system in communication with the set of transmitters and the set of sensors, wherein the structural health monitoring system is configured to send a first test signal into a baseline structure;
- receive a first response signal from the baseline structure;
- compute a baseline propagation model for the structure;
- send a second test signal into a test structure;
- receive a second response signal to the second test signal sent into the test structure;
- compute a wave propagation model for the test structure;
- assign a value to a model-based dissimilarity index using a baseline response and a test response;
- and
- transform the dissimilarity index to become at least substantially independent of a length of a path between a transmitter and a sensor.
A computer program product for identifying dissimilarity indices for a structure, the computer program product comprising:
- a computer recordable storage medium;
- program code, stored on the computer recordable storage medium, for sending a first test signal into a baseline model of the structure;
- program code, stored on the computer recordable storage medium, for receiving a first response signal to the first test signal sent into the baseline model of the structure;
- program code, stored on the computer recordable storage medium, for sending a second test signal into the structure;
- program code, stored on the computer recordable storage medium, for receiving a second response signal to the second test signal sent into the structure;
- program code, stored on the computer recordable storage medium, for assigning a value to a model-based dissimilarity index using the first response and the second response signal;
- and
- program code, stored on the computer recordable storage medium, for calculating an average value of squared differences between the first response signal and the second response signal.
Dependencies are inferred from the claim text.