Back to results
US 2010/0076262 A1Published application
Endoscope inspection system
AssigneeNational Taiwan University
InventorsWei-Zen Sun, Jaw Fu-Shan
Life of this patent
Estimating the term…
Abstract
An endoscope inspection system. An image-capturing device is disposed on an endoscope probe and is electrically connected to a signal conditioning unit. A differential electrode set includes an annular detecting electrode and a reference electrode. The annular detecting electrode surrounds the endoscope probe. The annular detecting electrode, reference electrode, and display are electrically connected to the signal conditioning unit.
Claims6
An endoscope inspection system, comprising:
- a signal conditioning unit;
- an endoscope probe;
- an image-capturing device disposed on the endoscope probe and electrically connected to the signal conditioning unit;
- a differential electrode set comprising an annular detecting electrode and a reference electrode, wherein the annular detecting electrode surrounds the endoscope probe, and the annular detecting electrode and reference electrode are electrically connected to the signal conditioning unit;
- and
- a display electrically connected to the signal conditioning unit.
3 more elements
Dependencies are inferred from the claim text.