3d geometric modeling and 3d video content creation

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a predefined set of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• providing a coded light pattern comprising multiple appearances of said feature types;
• projecting said coded light pattern on said objects such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features;
• capturing a 2D image of said objects having said projected coded light pattern projected thereupon, said 2D image comprising reflected said feature types;
• and
• extracting:
• a) said reflected feature types according to the unique bi-dimensional formations;
• and
• b) locations of said reflected feature types on respective said epipolar lines in said 2D image.

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a predefined set of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• providing a coded light pattern comprising multiple appearances of said feature types;
• projecting said coded light pattern on said objects at an angle in relation to said epipolar lines, said angle being in accordance with a determined limiting distance between said distinguishable epipolar lines;
• capturing a 2D image of said objects having said projected coded light pattern projected thereupon, said 2D image comprising reflected said feature types;
• and
• extracting:
• a) said reflected feature types according to the unique bidimensional formations;
• and
• b) locations of said reflected feature types on respective said epipolar lines in said 2D image.

An apparatus configured to obtain data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said apparatus comprising:

• a predefined set of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• a coded light pattern comprising multiple appearances of said feature types;
• a projector configured to project said coded light pattern on said objects such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features;
• an imaging device configured to capture a 2D image of said objects having said projected coded light pattern projected thereupon, said 2D image comprising reflected said feature types;
• and
• an image processing device configured to extract:
• a) said reflected feature types according to the unique bi-dimensional formations;
• and
• b) locations of said reflected feature types on respective said epipolar lines in said 2D image.

A method of obtaining data from a 2D (two-dimensional) video sequence, comprising two or more frames, each frame being a 2D image, in order to determine the 3D (three-dimensional) shape of moving objects appearing in said 2D video sequence, each frame having distinguishable epipolar lines, said method comprising:

• providing a bi-dimensional coded light pattern having a plurality of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• projecting said coded light pattern on said moving objects such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features;
• capturing said 2D video sequence having said moving objects having said projected coded light pattern projected thereupon, said 2D video sequence comprising reflected said feature types;
• and
• extracting:
• a) said reflected feature types according to the unique bi-dimensional formations;
• and
• b) locations of said reflected feature types on respective said epipolar lines.

An apparatus configured to obtain data from 2D (two-dimensional) video sequence, comprising two or more frames, each frame being a 2D image, in order to determine the 3D (three-dimensional) shape of moving objects appearing in said 2D video sequence, each frame having distinguishable epipolar lines, said apparatus comprising:

• a bi-dimensional coded light pattern having a plurality of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• a projector configured to project said coded light pattern on said moving objects such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features;
• an imaging device configured to capture said 2D video sequence having said moving object having said projected coded light pattern projected thereupon, said 2D video sequence comprising reflected said feature types;
• and
• an image processing device configured to extract:
• a) said reflected feature types according to the unique bi-dimensional formations;
• and
• b) locations of said reflected feature types on respective said epipolar lines.

A method of obtaining distance data from a scene comprising one or more objects, the method comprising:

• projecting a bidimensional coded light pattern having a plurality of feature types onto said scene such that each feature of said light pattern is reflected from a different respective reflection location in said scene, giving rise to a reflected feature, said feature types being distinguishable according to a unique bi-dimensional formation, said projecting performed such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features;
• capturing a 2D (two-dimensional) image of said scene comprising the reflected features;
• determining for each said reflected feature appearing in said 2D image:
• a) a respective feature type according to said unique bi-dimensional formation;
• and
• b) a location of said each reflected feature on the respective epipolar line;
• and
• deriving for said each reflected feature, in accordance with the respective determined feature type and with the respective determined location on said respective epipolar line, a respective distance of a respective associated reflection location.

A system configured to obtain scene data from a target scene, the system comprising:

• a pattern-projecting apparatus operative to project a bi-dimensional coded light pattern having a plurality of feature types onto said scene such that each feature reflects from a respective reflection location, giving rise to a reflected feature, said feature types being distinguishable according to a unique bi-dimensional formation, wherein said coded light pattern are projected such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features;
• an image capture apparatus operative to capture a 2D (two-dimensional) image of said scene comprising the reflected features;
• and
• an image processing element operative, for each said reflected feature of said 2D image, to:
• i) determine, for said each reflected feature:
• A. a feature type according to said unique bi-dimensional formation;
• and
• B. a location of said each reflected feature on the respective epipolar line;
• and
• ii) derive, for each said reflected feature, in accordance with the respective determined feature type and with the respective determined location on the respective epipolar line, a respective distance of a respective associated reflection location.

A method of determining the 3D (three-dimensional) shape of imaged objects appearing in at least two obtained 2D (two-dimensional) images, said obtained images related to each other by defined epipolar fields, said method comprising:

• providing a bi-dimensional coded light pattern having a plurality of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• projecting said coded light pattern on said imaged objects such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features;
• capturing a first 2D image of said imaged objects;
• capturing a second 2D image of said imaged objects;
• selecting a pixel area PX1 of said first 2D image, the content appearing on PX1 being constrained to appear on a specific epipolar line EPm in said second 2D image;
• finding said content of said pixel area PX1 in said second 2D image along said epipolar line EPm;
• and
• determining locations of appearances of said content of said pixel area PX1 between said first and second 2D images.

A method of determining the 3D (three-dimensional) shape of imaged objects appearing in at least two obtained 2D (two-dimensional) images, said obtained images related to each other by defined epipolar fields, each epipolar field comprising one or more epipolar lines, said method comprising:

• providing a bi-dimensional coded light pattern having a plurality of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• projecting said coded light pattern on said imaged objects at an angle in relation to at least one of said epipolar fields, said angle being in accordance with a determined limiting distance between distinguishable epipolar lines;
• capturing a first 2D image of said imaged objects;
• capturing a second 2D image of said imaged objects;
• selecting a pixel area PX1 of said first 2D image, the content appearing on PX1 being constrained to appear on a specific epipolar line EPm in said second 2D image;
• finding said content of said pixel area PX1 in said second 2D image along said epipolar line EPm;
• and
• determining locations of appearances of said content of said pixel area PX1 between said first and second 2D images.

An apparatus configured to determine the 3D (three-dimensional) shape of imaged objects appearing in two or more obtained 2D (two-dimensional) images, said two or more 2D images being obtained from at least two imaging devices, said two or more 2D images being related to each other by defined epipolar fields, said apparatus comprising:

• a bi-dimensional coded light pattern having a plurality of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• a projector configured to project said coded light pattern on said imaged objects such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features;
• a first imaging device configured to capture a first 2D image of said imaged objects;
• a second imaging device configured to capture a second 2D image of said imaged objects;
• an image processing device configured to:
• a) select a pixel area PX1 of said first 2D image, the content appearing on said pixel area PX1 being constrained to appear on a specific epipolar line EPm in said second 2D image;
• b) find said content of said pixel area PX1 in said second 2D image along said epipolar line EPm;
• and
• c) determine locations of appearances of said content of said pixel area PX1 between said first and second 2D images.

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a bi-dimensional coded light pattern having a plurality of feature types, each of said feature types being distinguishable according to a unique bi-dimensional formation;
• providing the inverse of said bi-dimensional coded light pattern, giving rise to an inverse coded light pattern;
• projecting said coded light pattern and said inverse coded light pattern on said objects;
• capturing:
• i) a first 2D image of said objects, having said projected coded light pattern being projected thereupon, said first 2D image comprising reflected said feature types;
• and
• ii) a second 2D image of said objects, having said inverse coded light pattern projected thereupon, said second 2D image comprising reflected said feature types;
• obtaining a resultant image from the subtraction of said second 2D image from said first 2D image;
• and
• extracting said reflected feature types according to the unique bi-dimensional formations and the feature type locations on respective said epipolar lines in said resultant image.

An apparatus configured to obtain data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said apparatus comprising:

• a predefined set of feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• a bi-dimensional coded light pattern comprising multiple appearances of the feature types;
• an inverse bi-dimensional coded light pattern comprising multiple appearances of the inversed feature types;
• a projector configured to project said bi-dimensional coded light pattern and said inverse bi-dimensional light pattern on said objects;
• a first imaging device configured to capture a first 2D image of said objects, having said projected coded light pattern projected thereupon, said first 2D image comprising reflected said feature types;
• a second imaging device configured to capture a second 2D image of said objects, having said inverse coded light pattern projected thereupon, said second 2D image comprising reflected said feature types;
• and
• an image processing device configured to:
• i) obtain a resultant image from the subtraction of said second 2D image from said first 2D image;
• and
• ii) extract said reflected feature types according to the unique bi-dimensional formations and the feature type locations on respective said epipolar lines in said resultant image.

A method of obtaining texture data from two 2D (two-dimensional) images, each of said images containing a reflected code used to obtain depth data of imaged objects independently for each 2D image, said method comprising:

• providing a bi-dimensional coded light pattern having a plurality of feature types, each feature type being distinguishable according to a unique bi-dimensional formation,
• providing the inverse of said bi-dimensional coded light pattern, giving rise to an inverse coded light pattern;
• projecting said coded light pattern and said inverse coded light pattern on said objects;
• capturing:
• i) a first 2D image of said objects, having said projected coded light pattern projected thereupon, said first 2D image comprising reflected said feature types,
• ii) a second 2D image of said objects, having said inverse coded light pattern projected thereupon, said second 2D image comprising reflected said feature types,
• obtaining a resultant image from the addition of said second 2D image with said first 2D image, said resultant image providing texture information of said imaged objects.

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a bi-dimensional coded light pattern having a plurality of feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• providing the inverse of said bi-dimensional coded light pattern, giving rise to an inverse coded light pattern;
• projecting said coded light pattern and said inverse coded light pattern on said objects;
• capturing:
• i) a first 2D image of said objects, having said projected coded light pattern projected thereupon, said first 2D image comprising reflected said feature types;
• and
• ii) a second 2D image of said objects, having said inverse coded light pattern projected thereupon, said second 2D image comprising reflected said feature types;
• obtaining a resultant image from the absolute value of the subtraction of said second 2D image from said first 2D image, said resultant image comprising outlines of said reflected feature types;
• and
• extracting said outlines and outline locations on respective said epipolar lines in said resultant image.

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a first bi-dimensional coded light pattern having a plurality of feature types, each feature type being distinguishable according to a unique bi-dimensional formation and each feature type comprising a plurality of elements having varying light intensity, wherein said plurality of elements comprises non-maximum and non-minimum elements and comprises one or more of the following:
• at least one maximum element;
• at least one minimum element;
• and
• at least one saddle element;
• providing a second bi-dimensional coded light pattern comprising said first bi-dimensional coded light pattern having the one or more maximum and/or minimum inverted elements;
• projecting said first bi-dimensional coded light pattern and said second bi-dimensional coded light pattern on said objects;
• capturing:
• i) a first 2D image of said objects, having said first projected bi-dimensional coded light pattern projected thereupon, said first 2D image comprising reflected said feature types;
• and
• ii) a second 2D image of said objects, having said second bi-dimensional coded light pattern projected thereupon, said second 2D image comprising reflected said feature types;
• obtaining a resultant image from the subtraction of said second 2D image from said first 2D image;
• and
• extracting from said resultant image one or more of the following:
• at least one maximum element, at least one minimum element and at least one saddle element, and extracting their locations respective to said epipolar lines in said resultant image.

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a first bi-dimensional coded light pattern having a plurality of feature types, each feature type being distinguishable according to a unique bi-dimensional formation and each feature type comprising a plurality of elements having varying light intensity, wherein said plurality of elements comprising non-maximum and non-minimum elements and comprising one or more of the following:
• at least one maximum element;
• at least one minimum element;
• and
• at least one saddle element;
• providing a second bi-dimensional coded light pattern comprising said first bi-dimensional coded light pattern having the one or more maximum and/or minimum inverted elements;
• projecting said first bi-dimensional coded light pattern and said second bi-dimensional coded light pattern on said objects;
• capturing:
• i) a first 2D image of said objects, having said first projected coded light pattern projected thereupon, said first 2D image comprising reflected said feature types;
• and
• ii) a second 2D image of said objects, having said second coded light pattern projected thereupon, said second 2D image comprising reflected said feature types;
• obtaining a resultant image from the addition of said second 2D image with said first 2D image;
• and
• extracting from said resultant image one or more said non-maximum and non-minimum elements and extracting locations of said non-maximum and non-minimum elements on one or more respective epipolar lines in said resultant image.

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a first bi-dimensional coded light pattern having a plurality of feature types, each feature type being distinguishable according to a unique bi-dimensional formation and each feature type comprising a plurality of elements having varying light intensity, wherein said plurality of elements comprises non-maximum and non-minimum elements and comprises one or more of the following:
• at least one maximum element;
• at least one minimum element;
• and
• at least one saddle element;
• providing a second bi-dimensional coded light pattern comprising said first bi-dimensional coded light pattern having the one or more maximum and/or minimum inverted elements;
• projecting said first bi-dimensional coded light pattern and said second bi-dimensional coded light pattern on said objects;
• capturing:
• i) a first 2D image of said objects, having said first projected bi-dimensional coded light pattern projected thereupon, said first 2D image comprising reflected said feature types;
• and
• ii) a second 2D image of said objects, having said second bi-dimensional coded light pattern projected thereupon, said second 2D image comprising reflected said feature types;
• obtaining a resultant image from the absolute value of the subtraction of said second 2D image from said first 2D image, said resultant image comprising borderlines of said reflected feature types;
• and
• extracting said borderlines and borderline locations on respective said epipolar lines in said resultant image.

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a first bi-dimensional coded light pattern having a plurality of feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• providing a second bi-dimensional coded light pattern, different from said first pattern, having a plurality of feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• projecting said first coded light pattern and said second coded light pattern on said objects;
• capturing:
• i) a first 2D image of said objects having said first projected coded light pattern projected thereupon, said first 2D image comprising reflected said feature types;
• and
• ii) a second 2D image of said objects having said second coded light pattern projected thereupon, said second 2D image comprising reflected said feature types;
• extracting, in each image independently, said reflected feature types according to the unique bi-dimensional formations and the feature type locations on respective said epipolar lines;
• and
• comparing regions of epipolar lines in said second 2D image to similar regions along same epipolar lines in said first 2D image to verify feature identities in said first 2D image.

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a bi-dimensional coded light pattern having a plurality of feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• projecting said bi-dimensional coded light pattern on said objects;
• capturing:
• i) a first 2D image of said objects, having said projected coded light pattern projected thereupon, said first 2D image comprising reflected said feature types;
• and
• ii) a second 2D image of said objects, having ambient light projected thereupon;
• obtaining a resultant image from the subtraction of said second 2D image from said first 2D image;
• and
• extracting said reflected feature types and locations of said reflected feature types on respective said epipolar lines in said resultant image.

A method of obtaining data from a 2D (two-dimensional) image in order to determine the 3D (three-dimensional) shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising:

• providing a bi-dimensional coded light pattern having a plurality of feature types, each feature type being distinguishable according to a unique bi-dimensional formation;
• projecting said coded light pattern on said objects;
• capturing:
• i) a first 2D image of said objects, having said projected coded light pattern projected thereupon, said first 2D image comprising reflected said feature types;
• and
• ii) a second 2D image of said objects, having uniform light projected thereupon;
• obtaining a resultant image from the division of said first 2D image by said second 2D image;
• and
• extracting said reflected feature types and the locations of said reflected feature types on respective said epipolar lines in said resultant image.