Method to determine phase and/or amplitude between interfering, adjacent x-ray beams in a detector pixel in a talbot interferometer
AssigneeSiemens Aktiengesellschaft
InventorStefan Popescu
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AssigneeSiemens Aktiengesellschaft
InventorStefan Popescu
Estimating the term…
In a method to determine phase and/or amplitude between interfering, adjacent x-ray beams in a detector pixel in a Talbot interferometer for projective and tomographical x-ray phase contrast imaging and/or x-ray dark field imaging, after an irradiation of the examination subject with at least two coherent or quasi-coherent x-rays, an interference of the at least two coherent or quasi-coherent x-rays with the aid of an irradiated phase grating is generated, and the variation of multiple intensity measurements in temporal succession after an analysis grating is determined in relation to known displacements of one of the gratings or of an x-ray source fashioned like a grating, positioned upstream in the beam path, relative to one of the gratings. The integrating intensity measurements ensue during a relative movement—thus not during the standstill—of one of the upstream gratings or of the x-ray source fashioned like a grating or of the examination subject, with known speed behavior over a final time interval of a final distance.
A method to determine phase (x0) and/or amplitude (Iamp) and/or median value (Imed) of an intensity curve (Ix) of interfering, adjacent x-ray beams after an analysis grating depending on a relative displacement of a grating or of an examination subject in a detector pixel in an x-ray grating interferometer or x-ray phase contrast CT or an x-ray dark field radiography system, comprising the steps of:
X-ray grating interferometer possessing a computer to control a measurement process, characterized in that the computer comprises a program memory in which a program or program module is stored that executes the method according to any of the preceding method claims upon operation.
Dependencies are inferred from the claim text.