US 2010/0073658 A1 · LASER LIGHT SOURCE DEVICE, EXPOSURE DEVICE, AND MASK INSPECTION DEVICE USING THIS LASER LIGHT SOURCE DEVICE

Abstract

A laser light source device 1, comprising M number of laser light sources, of which frequency is shifted from a fundamental frequency by (m−1)·a·Δω, a first laser light source section 2 and a first fiber amplifier section 4 for amplifying these laser lights, a first optical multiplexer 6 for approximately coaxially superimposing the laser lights emitted from the first fiber amplifier section 4 and emitting the laser lights, a first wavelength conversion device 9 for multiplying the frequency of the laser lights emitted from the first optical multiplexer 6 by A, M number of laser light sources, of which frequency is shifted from the fundamental frequency by (m−1)·b·Δω, a second laser light source section 3 and a second fiber amplifier section 5 for amplifying these laser lights, a second optical multiplexer 7 for approximately coaxially superimposing the laser lights emitted from the second fiber amplifier section 5 and emitting the laser lights, a second wavelength conversion device 10 for multiplying the frequency of the laser lights emitted from the second optical multiplexer 7 by B, and a third wavelength conversion device 11 for simultaneously receiving the laser lights emitted from the first and second wavelength conversion devices 9 and 10 and converting the laser lights into laser lights, of which frequency is (A+B) times the fundamental frequency, the laser light source device 1 being characterized in that the expression A·a+B·b=0 is satisfied.

Claims14

Dependent claims

An exposure device, comprising:

a laser light source device;
an illumination optical system for irradiating laser lights emitted from the laser light source device on a reticle;
and
a projection optical system for condensing the laser lights transmitted through the reticle on a semiconductor wafer and forming an image of the reticle, and
the laser light source device comprising,
a first laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from a first fundamental frequency by amΔω (m=1, 2, . . . , M);
a second laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from a second fundamental frequency by bm·Δω (m=1, 2, . . . , M);
a first optical multiplexer for emitting a first fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the first laser light source section;
a second optical multiplexer for emitting a second fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the second laser light source section;
and
a wavelength conversion optical system, comprising a first wavelength conversion device for generating an A-harmonic wave, of which frequency corresponds to A times of the first fundamental wave, a second wavelength conversion device for generating a B-harmonic wave, of which frequency corresponds to B times of the second fundamental wave, and a third wavelength conversion device for receiving light of the A-harmonic wave and the B-harmonic wave, and generating a sum frequency thereof by sum frequency generation,
the laser light source device being characterized in that Expression A·am+B bm=0 (al, a2, . . . aM and b1, b2, . . . , bM are arbitrary numbers that satisfy the expression) is satisfied.

9 more elements

An exposure device, comprising:

a laser light source device;
an illumination optical system for irradiating laser lights emitted from the laser light source device on a reticle;
and
a projection optical system for condensing the laser lights transmitted through the reticle on a semiconductor wafer and forming an image of the reticle, and
the laser light source device comprising,
a first laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from a fundamental frequency by am·Δω (m=1, 2, . . . , M);
a second laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from the fundamental frequency by bm·Δω (m=1, 2, . . . , M);
a first optical multiplexer for emitting a first fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the first laser light source section;
a second optical multiplexer for emitting a second fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the second laser light source section;
and
a wavelength conversion optical system, comprising a first wavelength conversion device for generating a third-harmonic wave, of which frequency corresponds to triple the first fundamental wave, a second wavelength conversion device for generating a fourth-harmonic wave, of which frequency corresponds to four times the second fundamental wave, and a third wavelength conversion device for receiving the third-harmonic wave and the fourth-harmonic wave, and generating a seventh-harmonic wave of which frequency is seven times the fundamental frequency by sum frequency generation,
the laser light source device being characterized in that expression 3·am+4·bm=0 (a1, a2, . . . , aM and b1, b2, . . . , bM are arbitrary numbers that satisfy the expression) is satisfied.

9 more elements

An exposure device, comprising:

a laser light source device;
an illumination optical system for irradiating laser lights emitted from the laser light source device on a reticle;
and
a projection optical system for condensing the laser lights transmitted through the reticle on a semiconductor wafer and forming an image of the reticle, and
the laser light source device comprising,
a first laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from a fundamental frequency by am·Δω (m=1, 2, . . . , M);
a second laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from the fundamental frequency by bm·Δω (m=1, 2, . . . , M);
a first optical multiplexer for emitting a first fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the first laser light source section;
a second optical multiplexer for emitting a second fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the second laser light source section;
and
a wave length conversion optical system, comprising a first wavelength conversion device for generating a third-harmonic wave, of which frequency corresponds to triple the first fundamental wave, a second wave length conversion device for generating a fourth-harmonic wave, of which frequency corresponds to four times the second fundamental wave, a third wavelength conversion device for receiving the third-harmonic wave and the fourth-harmonic wave and generating a seventh-harmonic wave of which frequency is shifted from a frequency that is seven times the fundamental frequency by bm·Δω (m=1, 2, . . . , M) by sum frequency generation, and a fourth wavelength conversion device for receiving a part of the second fundamental wave and the seventh-harmonic wave and generating an eighth-harmonic wave of which frequency is eight times the fundamental frequency by sum frequency generation,
the laser light source device being characterized in that expression 3·am+5·bm=0 (a1, a2, . . . , aM and b1, b2, . . . , bM are arbitrary numbers that satisfy the expression) is satisfied.

9 more elements

An exposure device, comprising:

a laser light source device;
an illumination optical system for irradiating laser lights emitted from the laser light source device on a reticle;
and
a projection optical system for condensing the laser lights transmitted through the reticle on a semiconductor wafer and forming an image of the reticle, and
the laser light source device comprising,
a first laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted form a fundamental frequency by am·Δω (m=1, 2, . . . , M);
a second laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from the fundamental frequency by bm·Δω (m=1, 2, . . . , M);
a first optical multiplexer for emitting a first fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the first laser light source section;
a second optical multiplexer for emitting a second fundamental wave by appropriately coaxially superimposing M number of laser lights emitted from the second laser light source section;
and
a wavelength conversion optical system, comprising a first wavelength conversion device for generating a second-harmonic wave, of which frequency corresponds to double the first fundamental wave, a second wavelength conversion device for generating a fifth-harmonic wave, of which frequency corresponds to five times the second fundamental wave, a third wavelength conversion device for receiving the second-harmonic wave and the fifth-harmonic wave and generating a seventh-harmonic wave of which frequency is seven times the fundamental frequency by sum frequency generation, and a fourth wavelength conversion device for receiving the seventh-harmonic wave and the first fundamental wave transmitted through the first wavelength conversion device and third wavelength conversion device, and generating an eighth-harmonic wave of which frequency is eight times the fundamental frequency by sum frequency generation,
the laser light source device being characterized in that the expression 3·am+5·bm=0 (a1, a2, . . . , aM and b1, b2, . . . , bM are arbitrary numbers that satisfy the expression) is satisfied.

9 more elements

A mask inspection device, comprising:

a laser light source device;
a phase conversion device for converting a phase of the laser light emitted from the laser light source device;
an illumination optical system for condensing the laser lights of which phases are converted by the phase conversion device and irradiating the condensed lights on a mask;
an image formation optical system for condensing the laser lights transmitted through the mask;
and
a sensor for detecting the laser light of which image is formed by the image formation optical system, and
the laser light source device comprising,
a first laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from a first fundamental frequency by am·Δω (m=1, 2, . . . , M);
a second laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from a second fundamental frequency by bm·Δω (m=1, 2, . . . , M);
a first optical multiplexer for emitting a first fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the first laser light source section;
a second optical multiplexer for emitting a second fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the second laser light source section;
and
a wavelength conversion optical system, comprising a first wavelength conversion device for generating an A-harmonic wave, of which frequency corresponds to A times of the first fundamental wave, a second wavelength conversion device for generating a B-harmonic wave, of which frequency corresponds to B times of the second fundamental wave, and a third wavelength conversion device for receiving light of the A-harmonic wave and the B-harmonic wave, and generating a sum frequency thereof by sum frequency generation,
the laser light source device being characterized in that Expression A·am+B·bm=0 (a1, a2, . . . aM and b1, b2, . . . , bM are arbitrary numbers that satisfy the expression) is satisfied.

11 more elements

A mask inspection device, comprising:

a laser light source device;
a phase conversion device for converting a phase of the laser light emitted from the laser light source device;
an illumination optical system for condensing the laser lights of which phases are converted by the phase conversion device and irradiating the condensed lights on a mask;
an image formation optical system for condensing the laser lights transmitted through the mask;
and
a sensor for detecting the laser light of which image is formed by the image formation optical system, and
the laser light source device comprising,
a first laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from a fundamental frequency by am·Δω (m=1, 2, . . . , M);
a second laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from the fundamental frequency by bm·Δω (m=1, 2, . . . , M);
a first optical multiplexer for emitting a first fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the first laser light source section;
a second optical multiplexer for emitting a second fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the second laser light source section;
and
a wavelength conversion optical system, comprising a first wavelength conversion device for generating a third-harmonic wave, of which frequency corresponds to triple the first fundamental wave, a second wavelength conversion device for generating a fourth-harmonic wave, of which frequency corresponds to four times the second fundamental wave, and a third wavelength conversion device for receiving the third-harmonic wave and the fourth-harmonic wave, and generating a seventh-harmonic wave of which frequency is seven times the fundamental frequency by sum frequency generation,
the laser light source device being characterized in that expression 3·am+4·bm=0 (a1, a2, . . . , aM and b1, b2, . . . , bM are arbitrary numbers that satisfy the expression) is satisfied.

11 more elements

A mask inspection device, comprising:

a laser light source device;
a phase conversion device for converting a phase of the laser light emitted from the laser light source device;
an illumination optical system for condensing the laser lights of which phases are converted by the phase conversion device and irradiating the condensed lights on a mask;
an image formation optical system for condensing the laser lights transmitted through the mask;
and
a sensor for detecting the laser light of which image is formed by the image formation optical system, and
the laser light source device comprising,
a first laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from a fundamental frequency by am·Δω (m=1, 2, . . . , M);
a second laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from the fundamental frequency by bm·Δω (m=1, 2, . . . , M);
a first optical multiplexer for emitting a first fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the first laser light source section;
a second optical multiplexer for emitting a second fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the second laser light source section;
and
a wave length conversion optical system, comprising a first wavelength conversion device for generating a third-harmonic wave, of which frequency corresponds to triple the first fundamental wave, a second wave length conversion device for generating a fourth-harmonic wave, of which frequency corresponds to four times the second fundamental wave, a third wavelength conversion device for receiving the third-harmonic wave and the fourth-harmonic wave and generating a seventh-harmonic wave of which frequency is shifted from a frequency that is seven times the fundamental frequency by bm·Δω (m=1, 2, . . . , M) by sum frequency generation, and a fourth wavelength conversion device for receiving a part of the second fundamental wave and the seventh-harmonic wave and generating an eighth-harmonic wave of which frequency is eight times the fundamental frequency by sum frequency generation,
the laser light source device being characterized in that expression 3·am+5·bm=0 (a1, a2, . . . , aM and b1, b2, . . . , bM are arbitrary numbers that satisfy the expression) is satisfied.

11 more elements

A mask inspection device, comprising:

a laser light source device;
a phase conversion device for converting a phase of the laser light emitted from the laser light source device;
an illumination optical system for condensing the laser lights of which phases are converted by the phase conversion device and irradiating the condensed lights on a mask;
an image formation optical system for condensing the laser lights transmitted through the mask;
and
a sensor for detecting the laser light of which image is formed by the image formation optical system, and
the laser light source device comprising,
a first laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted form a fundamental frequency by am·Δω (m=1, 2, . . . , M);
a second laser light source section comprising M number of laser light sources, where the m-th laser light source emits a laser light having a frequency shifted from the fundamental frequency by bm·Δω (m=1, 2, . . . , M);
a first optical multiplexer for emitting a first fundamental wave by approximately coaxially superimposing M number of laser lights emitted from the first laser light source section;
a second optical multiplexer for emitting a second fundamental wave by appropriately coaxially superimposing M number of laser lights emitted from the second laser light source section;
and
a wavelength conversion optical system, comprising a first wavelength conversion device for generating a second-harmonic wave, of which frequency corresponds to double the first fundamental wave, a second wavelength conversion device for generating a fifth-harmonic wave, of which frequency corresponds to five times the second fundamental wave, a third wavelength conversion device for receiving the second-harmonic wave and the fifth-harmonic wave and generating a seventh-harmonic wave of which frequency is seven times the fundamental frequency by sum frequency generation, and a fourth wavelength conversion device for receiving the seventh-harmonic wave and the first fundamental wave transmitted through the first wavelength conversion device and third wavelength conversion device, and generating an eighth-harmonic wave of which frequency is eight times the fundamental frequency by sum frequency generation,
the laser light source device being characterized in that the expression 3·am+5·bm=0 (a1, a2, . . . , aM and b1, b2, . . . , bM are arbitrary numbers that satisfy the expression) is satisfied.

11 more elements

Dependencies are inferred from the claim text.

Laser light source device, exposure device, and mask inspection device using this laser light source device

Life of this patent

Laser light source device, exposure device, and mask inspection device using this laser light source device

Life of this patent

Abstract

Claims14