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AssigneesNichepac Technology Inc., Da-Chung Contact Probes Enterprise Co., Ltd.
InventorsCheng-Lien Chiang, Sheng-Chang Huang
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A contact probe assembly, for placement within a probe receptacle for performing tests on an electrical device, includes the following elements. The hollow barrel has two openings at two opposite ends thereof, wherein the hollow barrel is adapted to be axially disposed within the probe receptacle. The first plunger is slidably disposed within one of the two openings at one end of the hollow barrel. The second plunger is slidably disposed within the other of the two openings at the opposite end of the hollow barrel. The resilient member is disposed within the hollow barrel and interconnected between the first plunger and second plunger, wherein the first plunger, the resilient member and the second plunger are formed as single one unitary member and made of the same electrically-conductive material.
A contact probe assembly for placement within a probe receptacle for performing tests on an electrical device, the contact probe assembly comprising:
A contact probe being adapted to be axially disposed within a probe receptacle directly for performing tests on an electrical device without a hollow barrel housing the contact probe, the contact probe consisting essentially of:
A contact probe assembly for placement within a probe receptacle for performing tests on an electrical device, the contact probe assembly being equipped with single one plunger, the contact probe assembly consisting essentially of:
Dependencies are inferred from the claim text.