Probe of electrical measuring instrument
AssigneeSamsung Electronics Co., Ltd.
InventorsJae Deok Lim, Byong Su Seol, Jong Sung Lee
Life of this patent
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Abstract
Disclosed is a probe of an electrical measuring instrument including a handle and at least one loop antenna coupled to the handle. A plane defined by the loop antenna is oriented to face an object to be inspected, to detect electrical characteristics in the vicinity of the object. Enhanced accessibility of the probe with respect to the object to be inspected results in an improvement in the accuracy of measured electrical characteristics information and use convenience of the probe by an inspector.
Claims27
A probe for inspecting an object, the probe comprising:
- a handle;
- and
- at least one loop antenna coupled to the handle,
- wherein a plane defined by the at least one loop antenna is oriented to face the object to be inspected to detect electrical characteristics in a vicinity of the object.
A probe for inspecting an object, the probe comprising:
- a handle;
- and
- a pair of loop antennas coupled to the handle and arranged parallel to each other in a single plane, the pair of loop antennas defining a plane facing the object to be inspected to detect electrical characteristics in a vicinity of the object.
A probe for inspecting an object, the probe comprising:
- a handle;
- a pair of loop antennas coupled to the handle, the pair of loop antennas being arranged parallel to each other in a plane;
- and
- a protective member enclosing and protecting the pair of loop antennas;
- wherein the plane faces the object to be inspected to detect electrical characteristics in a vicinity of the object.
A probe for inspecting an object, the probe comprising:
- a handle;
- and
- a pair of loop antennas arranged parallel to each other in a single plane to detect electrical characteristics in a vicinity of the object, wherein the pair of loop antennas are detachably coupled to the handle.
A probe for inspecting an object, the probe comprising:
- a handle;
- at least one loop antenna coupled to the handle;
- a protective member enclosing and protecting the at least one loop antenna;
- and
- a plurality of shields provided at the protective member to surround the at least one loop antenna to intercept noise.
A probe for inspecting an object, the probe comprising:
- a handle;
- at least one loop antenna coupled to the handle;
- and
- a chock electrically connected to the at least one loop antenna and used to intercept common mode noise.
Dependencies are inferred from the claim text.