Adjustable probe head
AssigneeTektronix, Inc.
InventorChristian K. RUPPELT
Life of this patent
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Abstract
An adjustable probe head consists of a probe head enclosing a plurality of test paths with a header that is attached to one of its opposing sides and electrically connected to the test paths. The header may be removably attached to the probe head. The probe head may enclose a board with an attached integrated circuit unit, and there may be a power cable and a signal cable connected to the board. There may be a clip that removably retains the probe head by releasably engaging with at least one of a plurality of slots on the sides of the probe head. The invention also includes a method of acquiring signals from an electrical device mounted on a test board. The electrical device may be a double data rate memory module.
Claims20
A probe assembly for acquiring signals from an electrical device, the comprising:
- a probe body;
- a signal conductor extending from the body for electrical connection to an instrument;
- an electrically conductive probe tip electrically connected to the signal conductor, extending from the body, and having a free end for contacting the device;
- an attachment element operably securable to the device;
- the attachment element having a facility for mechanically supporting the probe body;
- and
- the probe body having a plurality of attachment facilities, each adapted to connect to the attachment element, such that the probe body is attached in a different position with respect to the device depending on which of the attachment facilities is connected to the attachment element.
An electrical test connector comprising:
- a probe head having opposing sides and opposing ends;
- a header attached to one of the probe head's opposing sides;
- and
- a plurality of test paths enclosed by the probe head, each electrically connected to the header.
Dependencies are inferred from the claim text.