Semiconductor device design support apparatus and substrate netlist generation method
AssigneeNEC Electronics Corporation
InventorMikiko Tanaka
Life of this patent
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Abstract
A semiconductor device design support apparatus for generating a substrate netlist so as to be able to perform substrate noise analysis with high accuracy in a short time. The semiconductor device design support apparatus comprises a unit that divides a semiconductor device layout into a plurality of segments and generates a macro-model of the segments by using a current waveform of an instance included in the divided segments; a unit that replaces a pattern (termed as “substrate interface”) that is designed to be an interface with a substrate with respect to the segments, by a prescribed substrate interface diagram; and a unit that generates a substrate netlist, based on the substrate interface diagram of the plurality of segments.
Claims20
A semiconductor device design support apparatus comprising:
- a unit that divides a semiconductor device layout into a plurality of segments and generates a macro-model of said segments by using a current waveform of an instance included in said divided segments;
- a unit that replaces a pattern (termed as “substrate interface”), which is designed to be an interface with a substrate with respect to said segments, by a substrate interface diagram of a prescribed form;
- and
- a unit that generates a substrate netlist, based on said substrate interface diagram of said segments.
A substrate netlist generation method comprising:
- dividing a semiconductor device layout into a plurality of segments, and generating a macro-model of said segments by using a current waveform of an instance included in said divided segments;
- replacing a pattern (termed as “substrate interface”) that is designed to be an interface with a substrate with respect to said segments, by a substrate interface diagram of a prescribed form;
- and
- generating a substrate netlist, based on said substrate interface diagram of said segments.
Dependencies are inferred from the claim text.