US 2010/0064191 A1 · DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM

Abstract

Provided are a diagnostic device and the like providing a favorable diagnosis result by further improving the diagnosis resolution. A diagnostic device 1 has a symbol injection part 3, which is composed of a symbol injection part for an active element 5 and a symbol injection part for a passive element 7, an occurrence probability providing part 9, an equal occurrence probability providing part 11, and a switching part 13. A per-test X-fault diagnosis flow by the diagnostic device 1 consists of a stage for collecting diagnostic information and a stage for drawing diagnostic conclusion. The layout of a deep-submicron LSI circuit usually needs to involve multiple layers, which means that vias are extensively used. Since via information is utilized by the symbol injection part for a passive element 7, it becomes possible to locate defects to the via level, greatly improving the diagnostic resolution. Since, by the occurrence probability providing part 9, a new diagnosis value is used and, the occurrence probabilities of possible faulty logic combinations are taken into consideration, the reality in a deep-submicron LSI circuit is better reflected, which contributes to the improvement of diagnostic resolution.

Claims14

Dependent claims

-13. (canceled)

A diagnosis device for diagnosing a fault location of logical behavior caused by a physical defect existing in a multi-layered logic circuit, by representing the logical behavior with different distinction symbols assigned onto fanout branches,

an active element of the logic circuit being connected between different layers and to one or a plurality of passive elements,
the passive element including a connection element for connecting active elements in the logic circuit between different layers,
the diagnosis device comprising:
symbol injection means for an active element for assigning distinction symbols, which represent logical behaviors by one or a plurality of defects existing in the active element and/or in each of a plurality of signal lines from fanout branches which can propagate output signals of the active element, to each of a plurality of signal lines from fanout branches which can propagate output signals of the active element;
symbol injection means for a passive element for assigning new extended distinction symbols, which represent logical behaviors by one or a plurality of defects existing in the passive element and/or in each of a plurality of signal lines from fanout branches which can propagate output signals of the passive element, to each of a plurality of signal lines from fanout branches which can propagate output signals of the passive element;
and
fault locating means for locating the fault location by making use of distinction symbols assigned by the symbol injection means for an active element and the symbol injection means for a passive element.

4 more elements

A diagnosis device for diagnosing a fault location in a logic circuit of semiconductor equipment, comprising

occurrence probability providing means for calculating, for each possible faulty logic combination at a plurality of signal lines from fanout branches which can propagate output signals of an active element or a passive element, an occurrence probability which is based on relationship between voltage of the active element or the passive element and threshold voltage of each of a plurality of signal lines from the fanout branches and which are not equal for the whole faulty logic combination
wherein the diagnosis device diagnose with diagnosis value d(f, v) expressed by the following formula including occurrence probability p(Ri) calculated by the occurrence probability providing means:
d

(
f
,
v
,
Ri
)
=
Level


(
f
)
Lmax
×

Error_PO

(
v
)
⋂
Reach_PO

(
f
)


Reach_PO

(
f
)

if Ri is the same as ObvRes(v) on Reach_PO(f);
otherwise,
d(f, v, Ri)=0. And,
d

(
f
,
v
)
=
∑
i
=
1
k

(
d

(
f
,
v
,
Ri
)
×
p

(
Ri
)
)
where f denotes a fault, v denotes a test vector, R1, R2, . . . , Rk (k≧1) denotes logical combinations at primary outputs, corresponding to k possible faulty logic combinations C1, C2, . . . , Ck at a site of f, respectively, Error_PO(v) for a test vector v denotes a set of all primary outputs on which an observed response ObvRes(v) has errors, Reach_PO(f) denotes a set of primary outputs which is reachable from an active element or a passive element with a fault f, Level(f) denotes a level of output of an element with a fault f, and Lmax denotes the maximum level in a circuit, assuming that all primary outputs have level 1.

72 more elements

A diagnosis method for diagnosing a fault location of logical behavior caused by a physical defect existing in a multi-layered logic circuit, by representing the logical behavior with different distinction symbols assigned onto fanout branches,

an active element of the logic circuit being connected between different layers and to one or a plurality of passive element,
the passive element including a connection element for connecting active elements in the logic circuit between different layers,
the diagnosis method comprising steps of:
causing symbol injection means to assign distinction symbols, which represent logical behaviors by one or a plurality of defects existing in the active element and/or in each of a plurality of signal lines from fanout branches which can propagate output signals of the active element, to each of a plurality of signal lines from fanout branches which can propagate output signals of the active element, and to assign new extended distinction symbols, which represent logical behaviors by one or a plurality of defects existing in the passive element and/or in each of a plurality of signal lines from fanout branches which can propagate output signals of the passive element, to each of a plurality of signal lines from fanout branches which can propagate output signals of the passive element;
and
causing fault locating means to locate the fault location which occurred in the active element or the passive element by making use of distinction symbols assigned by the symbol injection means.

3 more elements

Dependencies are inferred from the claim text.

Diagnostic device, diagnostic method, program, and recording medium

Life of this patent

Diagnostic device, diagnostic method, program, and recording medium

Life of this patent

Abstract

Claims14