Information processing apparatus, voltage acceptance test system, and voltage acceptance test method
AssigneeFujitsu Limited
InventorKimihiro NISHIYAMA
Life of this patent
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AssigneeFujitsu Limited
InventorKimihiro NISHIYAMA
Estimating the term…
An information processing apparatus including: a test program 2 that acquires a first voltage value which is a voltage value at which a target apparatus operates, allows the target apparatus to operate at the first voltage value, and determines an operating state of the target apparatus; a voltage change controller 12 that changes, in the case where a result of the determination is abnormal state, a voltage value difference which is a difference between a voltage value at the next stage and the first voltage value or a time difference so as to reduce the change rate obtained by dividing the voltage value difference by the time difference and outputs, when a time obtained by adding the time difference to the current time has come, a second voltage value obtained by adding or subtracting to/from the first voltage value to the test program 2 as the first voltage value.
An information processing apparatus comprising:
A voltage acceptance test system comprising:
A voltage acceptance test method comprising:
Dependencies are inferred from the claim text.