Method for reducing occurrence of short-circuit failure in an organic functional device

A method, for reducing occurrence of short-circuit failure in an organic functional device (101, 201, 401) comprising a first transparent electrode layer (104), a second electrode layer (105) and an organic functional layer (103) sandwiched between said first and second electrode layers (104;

• 105), comprising the steps of:
• identifying (301) a portion of said organic functional device (101, 201, 401), said portion containing a defect (102a-g) leading to an increased risk of short-circuit failure;
• selecting (302) a segment (108a-g) of said second electrode layer (105), said segment corresponding to said portion, and;
• electrically isolating (303) said segment (108a-g) from a remainder of said second electrode layer (105), thereby eliminating short-circuit failure resulting from said defect (102a-g), characterized in that said step (301) of identifying a portion comprises the steps of:
• applying (501) an AC voltage between said electrode layers (104, 105), said voltage causing current to flow between said electrode layers (104, 105) due to said defect (102a-g) so that heat is generated periodically in said portion, and;
• identifying (502) said portion using an IR-detector (405) operating at a frequency (nfR), related to the frequency (fR) of said AC voltage.