Multichannel Optical Transport Network Time Domain Reflectometry Calibration
AssigneeApplied Micro Circuits Corporation
InventorsKeith Conroy, Omer Acikel, Francesco Caggioni
Life of this patent
Estimating the term…
Loading patent…
AssigneeApplied Micro Circuits Corporation
InventorsKeith Conroy, Omer Acikel, Francesco Caggioni
Estimating the term…
A system and method are provided for controlling time delay in a multichannel optical transport network (OTN) transmission device using time domain reflectometry (TDR) measurements. The method accepts a pair of 2n-phase shift keying (2n-PSK) modulated signals via Ix and Qx electrical signal paths, where n>1. Likewise, a pair of 2p-PSK modulated signals are accepted via Iy and Qy electrical signal paths where p>1. Using TDR modules, signal reflections are measured from an output port for each signal path. The method minimizes time delay differences in the signal reflections for the Ix, Qx, Iy, and Qy signals paths by using the signal reflection measurements to adjust time delay modules in each signal path.
A method for controlling time delay in a multichannel optical transport network (OTN) transmission device using time delay reflectometry measurements, the method comprising:
A system for controlling time delay in a multichannel optical transport network (OTN) transmission device using time delay reflectometry measurements, the system comprising:
Dependencies are inferred from the claim text.